ATS software design patterns
Toal, R.J., Hayes, R.G.
Published in 2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237) (2001)
Published in 2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237) (2001)
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Conference Proceeding
Numeric issues in test software correctness
Hayes, R.G., Hughes, G.B., Dorin, P.M., Toal, R.J.
Published in Proceedings, IEEE AUTOTESTCON (2002)
Published in Proceedings, IEEE AUTOTESTCON (2002)
Get full text
Conference Proceeding