Evaluation of electron tomography reconstruction methods for interface roughness measurement
Hayashida, Misa, Ogawa, Shinichi, Malac, Marek, Verkade, Paul
Published in Microscopy research and technique (01.05.2018)
Published in Microscopy research and technique (01.05.2018)
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Journal Article
Higher-order structure of barley chromosomes observed by electron tomography
Hayashida, Misa, Sartsanga, Channarong, Phengchat, Rinyaporn, Malac, Marek, Harada, Ken, Akashi, Tetsuya, Fukui, Kiichi, Ohmido, Nobuko
Published in Micron (Oxford, England : 1993) (01.09.2022)
Published in Micron (Oxford, England : 1993) (01.09.2022)
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Journal Article
Observation of FeGe skyrmions by electron phase microscopy with hole-free phase plate
Kotani, Atsuhiro, Harada, Ken, Malac, Marek, Salomons, Mark, Hayashida, Misa, Mori, Shigeo
Published in AIP advances (01.05.2018)
Published in AIP advances (01.05.2018)
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Journal Article
Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film
Malac, Marek, Hettler, Simon, Hayashida, Misa, Kawasaki, Masahiro, Konyuba, Yuji, Okura, Yoshi, Iijima, Hirofumi, Ishikawa, Isamu, Beleggia, Marco
Published in Micron (Oxford, England : 1993) (01.09.2017)
Published in Micron (Oxford, England : 1993) (01.09.2017)
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Journal Article
Hole free phase plate tomography for materials sciences samples
Hayashida, Misa, Cui, Kai, Najarian, Amin Morteza, McCreery, Richard, Jehanathan, Neerushana, Pawlowicz, Chris, Motoki, Sohei, Kawasaki, Masahiro, Konyuba, Yuji, Malac, Marek
Published in Micron (Oxford, England : 1993) (01.01.2019)
Published in Micron (Oxford, England : 1993) (01.01.2019)
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Journal Article
Hole-Free Phase Plate Imaging of a Phase Grating
Malac, Marek, Hayashida, Misa, Harada, Ken, Shimada, Keiko, Niitsu, Kodai, Rowan, Teddy, Beleggia, Marco
Published in Microscopy and microanalysis (01.08.2018)
Published in Microscopy and microanalysis (01.08.2018)
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Journal Article
Accurate measurement of relative tilt and azimuth angles in electron tomography: a comparison of fiducial marker method with electron diffraction
Hayashida, Misa, Malac, Marek, Bergen, Michael, Egerton, Ray F, Li, Peng
Published in Review of scientific instruments (01.08.2014)
Published in Review of scientific instruments (01.08.2014)
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Journal Article
High-accuracy electron tomography of semiconductor devices
Hayashida, Misa, Gunawan, Lina, Malac, Marek, Pawlowicz, Chris, Couillard, Martin
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
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Journal Article