Analysis of Hot Carrier Degradation of Lateral Double-Diffused Metal--Oxide--Semiconductor under Gate Pulse Stress
Furuya, Keiichi, Nitta, Tetsuya, Katayama, Toshiharu, Hatasako, Kenichi, Kuroi, Takashi, Maegawa, Shigeto
Published in Japanese Journal of Applied Physics (01.04.2010)
Published in Japanese Journal of Applied Physics (01.04.2010)
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Journal Article
Novel Design of Vertical Double-Diffused Metal–Oxide–Semiconductor Transistor for High Electrostatic Discharge Robustness
Hatasako, Kenichi, Yamamoto, Fumitoshi, Uenishi, Akio, Kuroi, Takashi, Maegawa, Shigeto
Published in Japanese Journal of Applied Physics (01.04.2009)
Published in Japanese Journal of Applied Physics (01.04.2009)
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Journal Article
Enhancement of current drivability in Field PMOS by optimized Field Plate
Tokumitsu, S, Nitta, T, Shiromoto, T, Kuroi, T, Hatasako, K, Maegawa, S
Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
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Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
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