Polysilicon TFT technology for active matrix OLED displays
Stewart, M., Howell, R.S., Pires, L., Hatalis, M.K.
Published in IEEE transactions on electron devices (01.05.2001)
Published in IEEE transactions on electron devices (01.05.2001)
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Journal Article
Electronic structure of CeF3 and TbF3 by valence-band XPS and theory
KLIER, K, NOVAK, P, MILLER, A. C, SPIRKO, J. A, HATALIS, M. K
Published in The Journal of physics and chemistry of solids (01.09.2009)
Published in The Journal of physics and chemistry of solids (01.09.2009)
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Journal Article
Poly-Si thin-film transistors on steel substrates
Howell, R.S., Stewart, M., Kamik, S.V., Saha, S.K., Hatalis, M.K.
Published in IEEE electron device letters (01.02.2000)
Published in IEEE electron device letters (01.02.2000)
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Journal Article
Characterization of cobalt annealed on silicon-germanium epilayers
Lin, F., Sarcona, G., Hatalis, M.K., Cserhati, A.F., Austin, Eva, Greve, D.W.
Published in Thin solid films (01.10.1994)
Published in Thin solid films (01.10.1994)
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Journal Article
High-Frequency Half-Bit Shift Register With Amorphous-Oxide TFT
Jamshidi-Roudbari, A., Khan, S.A., Hatalis, M.K.
Published in IEEE electron device letters (01.04.2010)
Published in IEEE electron device letters (01.04.2010)
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Journal Article
Electronic structure of CeF 3 and TbF 3 by valence-band XPS and theory
Klier, K., Novák, P., Miller, A.C., Spirko, J.A., Hatalis, M.K.
Published in The Journal of physics and chemistry of solids (2009)
Published in The Journal of physics and chemistry of solids (2009)
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Journal Article
Interfacial oxide, grain size, and hydrogen passivation effects on polysilicon emitter transistors
Potyraj, P.A., Chen, D.-L., Hatalis, M.K., Greve, D.W.
Published in IEEE transactions on electron devices (01.08.1988)
Published in IEEE transactions on electron devices (01.08.1988)
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Journal Article
Low-temperature polycrystalline silicon thin-film transistors for displays
Biay-Cheng-Hseih, Hatalis, M.K., Greve, D.W.
Published in IEEE transactions on electron devices (01.11.1988)
Published in IEEE transactions on electron devices (01.11.1988)
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