Impact of Aluminum Metallization Reconstruction on the Current Distribution in Power Semiconductors
Sippel, Marcel, Hassel, Simon, Schmidt, Ralf, Sprenger, Mario, Hecht, Christoph, Franke, Jorg
Published in 2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC) (13.09.2022)
Published in 2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC) (13.09.2022)
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