Analytical percolation model for predicting anomalous charge loss in flash memories
Degraeve, R., Schuler, F., Kaczer, B., Lorenzini, M., Wellekens, D., Hendrickx, P., van Duuren, M., Dormans, G.J.M., Van Houdt, J., Haspeslagh, L., Groeseneken, G., Tempel, G.
Published in IEEE transactions on electron devices (01.09.2004)
Published in IEEE transactions on electron devices (01.09.2004)
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Journal Article
A new scalable self-aligned dual-bit split-gate charge-trapping memory device
Breuil, L., Haspeslagh, L., Blomme, P., Wellekens, D., De Vos, J., Lorenzini, M., Van Houdt, J.
Published in IEEE transactions on electron devices (01.10.2005)
Published in IEEE transactions on electron devices (01.10.2005)
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Journal Article
SiGe based grating light valves: A leap towards monolithic integration of MOEMS
Rudra, S., Roels, J., Bryce, G., Haspeslagh, L., Witvrouw, A., Van Thourhout, D.
Published in Microelectronic engineering (01.05.2010)
Published in Microelectronic engineering (01.05.2010)
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Conference Proceeding
A highly reliable 3-D integrated SBT ferroelectric capacitor enabling FeRAM scaling
Goux, L., Russo, G., Menou, N., Lisoni, J.G., Schwitters, M., Paraschiv, V., Maes, D., Artoni, C., Corallo, G., Haspeslagh, L., Wouters, D.J., Zambrano, R., Muller, C.
Published in IEEE transactions on electron devices (01.04.2005)
Published in IEEE transactions on electron devices (01.04.2005)
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Journal Article
Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory
GOVOREANU, B, WELLEKENS, D, HASPESLAGH, L, BRUNCO, D. P, DE VOS, J, RUIZ AGUADO, D, BLOMME, P, VAN DER ZANDEN, K, VAN HOUDT, J
Published in Solid-state electronics (01.04.2008)
Published in Solid-state electronics (01.04.2008)
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Journal Article
Integration of SrBi2Ta2O9 thin films for high density ferroelectric random access memory
Wouters, D. J., Maes, D., Goux, L., Lisoni, J. G., Paraschiv, V., Johnson, J. A., Schwitters, M., Everaert, J.-L., Boullart, W., Schaekers, M., Willegems, M., Vander Meeren, H., Haspeslagh, L., Artoni, C., Caputa, C., Casella, P., Corallo, G., Russo, G., Zambrano, R., Monchoix, H., Vecchio, G., Van Autryve, L.
Published in Journal of applied physics (01.09.2006)
Published in Journal of applied physics (01.09.2006)
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Journal Article
Composition control and ferroelectric properties of sidewalls in integrated three-dimensional SrBi2Ta2O9-based ferroelectric capacitors
Goux, L., Lisoni, J. G., Schwitters, M., Paraschiv, V., Maes, D., Haspeslagh, L., Wouters, D. J., Menou, N., Turquat, Ch, Madigou, V., Muller, Ch, Zambrano, R.
Published in Journal of applied physics (01.09.2005)
Published in Journal of applied physics (01.09.2005)
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Journal Article
Scaling potential of pin-type 3-D SBT ferroelectric capacitors integrated in 0.18 μm CMOS technology
Goux, L., Maes, D., Lisoni, J.G., Vander Meeren, H., Paraschiv, V., Haspeslagh, L., Artoni, C., Russo, G., Zambrano, R., Wouters, D.J.
Published in Microelectronic engineering (01.10.2006)
Published in Microelectronic engineering (01.10.2006)
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Journal Article
Influence of Dry-Etch Patterning of Top Electrode and SrBi[sub 2]Ta[sub 2]O[sub 9] on the Properties of Ferroelectric Capacitors
Goux, L., Paraschiv, V., Lisoni, J. G., Schwitters, M., Maes, D., Haspeslagh, L., Wouters, D. J., Casella, P., Zambrano, R.
Published in Journal of the Electrochemical Society (2005)
Published in Journal of the Electrochemical Society (2005)
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Journal Article
Influence of different deposition conditions of top and bottom electrode on the reliability of Sr0.8Bi2.2Ta2O9 ferroelectric capacitors
Goux, L., Xu, Z., Paraschiv, V., Lisoni, J.G., Maes, D., Haspeslagh, L., Groeseneken, G., Wouters, D.J.
Published in Solid-state electronics (01.07.2006)
Published in Solid-state electronics (01.07.2006)
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Journal Article
Scaling effects in dual-bit split-gate nitride memory devices
Breuil, L., Haspeslagh, L., Lorenzini, M., Vos, J. De, Houdt, J. Van
Published in Solid-state electronics (01.11.2005)
Published in Solid-state electronics (01.11.2005)
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Conference Proceeding
MECHANICAL STABILITY OF Ir ELECTRODES USED FOR STACKED SrBi2Ta2O9 FERROELECTRIC CAPACITORS
LISONI, J. G., JOHNSON, J. A., EVERAERT, J. -L., GOUX, L., MEEREN, H. VANDER, PARASCHIV, V., WILLEGEMS, M., MAES, D., HASPESLAGH, L., WOUTERS, D. J., CAPUTA, C., ZAMBRANO, R.
Published in Integrated ferroelectrics (01.01.2006)
Published in Integrated ferroelectrics (01.01.2006)
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Journal Article
Embedded HIMOS(R) flash memory in 0.35 μm and 0.25 μm CMOS technologies
Wellekens, D., Van Houdt, J., Haspeslagh, L., Tsouhlarakis, J., Hendrickx, P., Deferm, L., Maes, H.E.
Published in IEEE transactions on electron devices (01.11.2000)
Published in IEEE transactions on electron devices (01.11.2000)
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Journal Article
A flash memory technology with quasi-virtual ground array for low-cost embedded applications
Tsouhlarakis, J., Vanhorebeek, G., Verhoeven, G., De Blauwe, J., Shiho Kim, Wellekens, D., Hendrickx, P., Haspeslagh, L., Van Houdt, J., Maes, H.
Published in IEEE journal of solid-state circuits (01.06.2001)
Published in IEEE journal of solid-state circuits (01.06.2001)
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Journal Article
Why CMOS-integrated transducers? A review
WITVROUW, A, VAN STEENKISTE, F, DE CAUSSEMAEKER, A, PARMENTIER, B, BAERT, K, MAES, D, HASPESLAGH, L, VAN GERWEN, P, DE MOOR, P, SEDKY, S, VAN HOOF, C, DE VRIES, A. C, VERBIST, A
Published in Microsystem technologies : sensors, actuators, systems integration (2000)
Published in Microsystem technologies : sensors, actuators, systems integration (2000)
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Journal Article
Comparative reliability investigation of different nitride based local charge trapping memory devices
Breuil, L., Haspeslagh, L., Blomme, P., Lorenzini, M., Wellekens, D., De Vos, J., Van Houdt, J.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
Scanrom, a novel non-volatile memory cell storing 9 bits
Rosmeulen, M., Van Houdt, J., Haspeslagh, L., De Meyer, K.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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Conference Proceeding