An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes
Harrach, HS von, Dona, P, Freitag, B, Soltau, H, Niculae, A, Rohde, M
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
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Journal Article
Comparison of the Detection Limits of EDS and EELS in S/TEM
von Harrach, HS, Klenov, D, Freitag, B, Schlossmacher, P, Collins, PC, Fraser, HL
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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Journal Article
Optimization of EDX performance in Tecnai TEMs
von Harrach, H.S, Freitag, B, Gerits, W, Sandborg, A
Published in Micron (Oxford, England : 1993) (01.01.2003)
Published in Micron (Oxford, England : 1993) (01.01.2003)
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Journal Article
The Optimization of EDX Performance in Tecnai TEMs
von Harrach, H.S., Freitag, B., Gerits, W., van Cappellen, E., Sandborg, A.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
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Journal Article