X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology
Harith, Ashrith S, Liu, Yingdi, Mukherjee, Nilanjan, Mayer, Jeff
Published in 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) (06.01.2024)
Published in 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) (06.01.2024)
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