Ionizing radiation tolerance and low-frequency noise degradation in UHV/CVD SiGe HBT's
Babcock, J.A., Cressler, J.D., Vempati, L.S., Clark, S.D., Jaeger, R.C., Harame, D.L.
Published in IEEE electron device letters (01.08.1995)
Published in IEEE electron device letters (01.08.1995)
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Journal Article
On the Challenges of SiGe HBTs in Advanced BiCMOS Technology Toward Half THz f MAX
Liu, Qizhi, Jain, Vibhor, Camillo-Castillo, Renata A, Pekarik, John J, Adkisson, James W., Joseph, Alvin, Harame, David L.
Published in ECS transactions (18.08.2016)
Published in ECS transactions (18.08.2016)
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Journal Article
On the Challenges of SiGe HBTs in Advanced BiCMOS Technology Toward Half THz fMAX
Liu, Qizhi, Jain, Vibhor, Camillo-Castillo, Renata A, Pekarik, John J, Adkisson, James W., Joseph, Alvin, Harame, David L.
Published in ECS transactions (18.08.2016)
Published in ECS transactions (18.08.2016)
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Journal Article
A high-speed complementary silicon bipolar technology with 12-fJ power-delay product
Cressler, J.D., Warnock, J., Harame, D.L., Burghartz, J.N., Jenkins, K.A., Chuang, C.-T.
Published in IEEE electron device letters (01.11.1993)
Published in IEEE electron device letters (01.11.1993)
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Journal Article
Low Power FDSOI Technology and Devices for RF Applications
Schwan, Christoph, Chew, Kok Wai, Feudel, Thomas, Kammler, Thorsten, Faul, Juergen, Kang, Laegu, Taylor, Richard, Huschka, Andreas, Kluth, Jon, Carter, Rick, McKay, Thomas, Nowak, Edward, Watts, Josef, Harame, David L.
Published in ECS transactions (18.08.2016)
Published in ECS transactions (18.08.2016)
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Journal Article
Status and Direction of Communication Technologies - SiGe BiCMOS and RFCMOS
Joseph, A.J., Dunn, J., Nowak, E., Harame, D.L., Jagannathan, B., Coolbaugh, D., Ahlgren, D., Magerlein, J., Lanzerotti, L., Feilchenfeld, N., St Onge, S.
Published in Proceedings of the IEEE (2005)
Published in Proceedings of the IEEE (2005)
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Journal Article
A simple four-port parasitic deembedding methodology for high-frequency scattering parameter and noise characterization of SiGe HBTs
Qingqing Liang, Cressler, J.D., Guofu Niu, Yuan Lu, Freeman, G., Ahlgren, D.C., Malladi, R.M., Newton, K., Harame, D.L.
Published in IEEE transactions on microwave theory and techniques (01.11.2003)
Published in IEEE transactions on microwave theory and techniques (01.11.2003)
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Journal Article
A 10Gb/s 6Vpp differential modulator driver in 0.18μm SiGe-BiCMOS
Yi Zhao, Vera, L., Long, J. R., Harame, D. L.
Published in 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers (01.02.2013)
Published in 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers (01.02.2013)
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Conference Proceeding
RF linearity characteristics of SiGe HBTs
Guofu Niu, Qingqing Liang, Cressler, J.D., Webster, C.S., Harame, D.L.
Published in IEEE transactions on microwave theory and techniques (01.09.2001)
Published in IEEE transactions on microwave theory and techniques (01.09.2001)
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Journal Article
SiGe heterojunctions: devices and applications
Arienzo, Maurizio, Comfort, James H., Crabbé, Emmanuel F., Harame, David L., Iyer, Subramanian S., Kesan, Vijay P., Meyerson, Bernard S., Patton, Gary L., Stork, Johannes M.C., Sun, Yuan-Chen
Published in ESSDERC '92: 22nd European Solid State Device Research conference (1992)
Published in ESSDERC '92: 22nd European Solid State Device Research conference (1992)
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Journal Article
Conference Proceeding
Foundation of rf CMOS and SiGe BiCMOS technologies
Dunn, James S, Ahlgren, David C, Coolbaugh, Douglas D, Feilchenfeld, Natalie B
Published in IBM journal of research and development (01.03.2003)
Published in IBM journal of research and development (01.03.2003)
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Journal Article
Carrier Injection Micro-ring Modulator with a High Drop Signal ON-OFF Ratio Fabricated in AIM Photonics Technology
Uddin, M. Rakib, Dikshit, Amit, Hossain, M. Jobayer, Timalsina, Yukta, Khatijah, Siti, Mann, Javery, Fahrenkopf, Nicholas M., Baiocco, Christopher, Harame, David L.
Published in 2023 Conference on Lasers and Electro-Optics (CLEO) (01.05.2023)
Published in 2023 Conference on Lasers and Electro-Optics (CLEO) (01.05.2023)
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Conference Proceeding
The effects of operating bias conditions on the proton tolerance of SiGe HBTs
Zhang, Shiming, Cressler, John D., Niu, Guofu, Marshall, Cheryl J., Marshall, Paul W., Kim, Hak S., Reed, Robert A., Palmer, Michael J., Joseph, Alvin J., Harame, David L.
Published in Solid-state electronics (01.10.2003)
Published in Solid-state electronics (01.10.2003)
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Journal Article
Product applications and technology directions with SiGe BiCMOS
Joseph, A.J., Dunn, J., Freeman, G., Harame, D.L., Coolbaugh, D., Groves, R., Stein, K.J., Volant, R., Subbanna, S., Marangos, V.S., Onge, S.S., Eshun, E., Cooper, P., Johnson, J.B., Jae-Sung Rieh, Jagannathan, B., Ramachandran, V., Ahlgren, D., Dawn Wang, Wang, X.
Published in IEEE journal of solid-state circuits (01.09.2003)
Published in IEEE journal of solid-state circuits (01.09.2003)
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Journal Article
Co-integration of high-performance and high-breakdown SiGe HBTs in a BiCMOS technology
Pekarik, John J., Adkisson, James W., Camillo-Castillo, Renata, Cheng, Peng, DiVergilio, Adam W., Gray, Peter B., Jain, Vibhor, Kaushal, Vikas, Khater, Marwan H., Liu, Qizhi, Harame, David L.
Published in 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.09.2012)
Published in 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.09.2012)
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Conference Proceeding
SiGe-channel heterojunction p-MOSFET's
Verdonckt-Vandebroek, S., Crabbe, E.F., Meyerson, B.S., Harame, D.L., Restle, P.J., Stork, J.M.C., Johnson, J.B.
Published in IEEE transactions on electron devices (01.01.1994)
Published in IEEE transactions on electron devices (01.01.1994)
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Journal Article
On the consistent modeling of band-gap narrowing for accurate device-level simulation of scaled SiGe HBTs
Yun Shi, Guofu Niu, Cressler, J.D., Harame, D.L.
Published in IEEE transactions on electron devices (01.05.2003)
Published in IEEE transactions on electron devices (01.05.2003)
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Journal Article
Status and direction of communication technologies : SiGe BiCMOS and RFCMOS: Special issue on silicon germanium - advanced technology, modeling, and design
JOSEPH, Alvin J, HARAME, David L, NOWAK, Edward, JAGANNATHAN, Basanth, COOLBAUGH, Doug, AHLGREN, David, MAGERLEIN, John, LANZEROTTI, Louis, FEILCHENFELD, Natalie, ONGE, Stephen St, DUNN, James
Published in Proceedings of the IEEE (2005)
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Published in Proceedings of the IEEE (2005)
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