Lattice tilt and strain mapped by X‐ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals
Meduňa, Mojmír, Isa, Fabio, Jung, Arik, Marzegalli, Anna, Albani, Marco, Isella, Giovanni, Zweiacker, Kai, Miglio, Leo, von Känel, Hans
Published in Journal of applied crystallography (01.04.2018)
Published in Journal of applied crystallography (01.04.2018)
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Journal Article
X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers
Meduňa, Mojmír, Kreiliger, Thomas, Mauceri, Marco, Puglisi, Marco, Mancarella, Fulvio, La Via, Francesco, Crippa, Danilo, Miglio, Leo, Känel, Hans von
Published in Journal of crystal growth (01.02.2019)
Published in Journal of crystal growth (01.02.2019)
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Journal Article
Dislocation-Free SiGe/Si Heterostructures
Montalenti, Francesco, Rovaris, Fabrizio, Bergamaschini, Roberto, Miglio, Leo, Salvalaglio, Marco, Isella, Giovanni, Isa, Fabio, von Känel, Hans
Published in Crystals (Basel) (19.06.2018)
Published in Crystals (Basel) (19.06.2018)
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Journal Article
Defect Reduction in Epitaxial 3C-SiC on Si(001) and Si(111) by Deep Substrate Patterning
Puglisi, Marco, von Känel, Hans, MIGLIO, Leo, Crippa, Danilo, Kreiliger, Thomas, Piluso, Nicolo’, Mauceri, Marco, La Via, Francesco, Anzalone, Ruggero, Mancarella, Fulvio
Published in Materials science forum (30.06.2015)
Published in Materials science forum (30.06.2015)
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Journal Article
Reconstruction of crystal shapes by X-ray nanodiffraction from three-dimensional superlattices
Meduňa, Mojmír, Falub, Claudiu V., Isa, Fabio, Chrastina, Daniel, Kreiliger, Thomas, Isella, Giovanni, von Känel, Hans
Published in Journal of applied crystallography (01.12.2014)
Published in Journal of applied crystallography (01.12.2014)
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Journal Article
3C-SiC Epitaxy on Deeply Patterned Si(111) Substrates
La Via, Francesco, Crippa, Danilo, MIGLIO, Leo, von Känel, Hans, Kreiliger, Thomas, Schöner, Adolf, Puglisi, Marco, Marzegalli, Anna, Mauceri, Marco, Mancarella, Fulvio, Kaplan, Wlodek
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
The Radon transform as a tool for 3D reciprocal‐space mapping of epitaxial microcrystals
Meduňa, Mojmír, Isa, Fabio, Bressan, Franco, von Känel, Hans
Published in Journal of applied crystallography (01.08.2022)
Published in Journal of applied crystallography (01.08.2022)
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Journal Article
Growth temperature dependent strain in relaxed Ge microcrystals
Meduňa, Mojmír, Falub, Claudiu Valentin, Isa, Fabio, von Känel, Hans
Published in Thin solid films (31.10.2018)
Published in Thin solid films (31.10.2018)
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Journal Article
Scaling Hetero-Epitaxy from Layers to Three-Dimensional Crystals
Falub, Claudiu V., von Känel, Hans, Isa, Fabio, Bergamaschini, Roberto, Marzegalli, Anna, Chrastina, Daniel, Isella, Giovanni, Müller, Elisabeth, Niedermann, Philippe, Miglio, Leo
Published in Science (American Association for the Advancement of Science) (16.03.2012)
Published in Science (American Association for the Advancement of Science) (16.03.2012)
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Journal Article
Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM
Arroyo Rojas Dasilva, Yadira, Erni, Rolf, Isa, Fabio, Isella, Giovanni, von Känel, Hans, Gröning, Pierangelo, Rossell, Marta D.
Published in Acta materialia (01.04.2019)
Published in Acta materialia (01.04.2019)
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Journal Article
Selective Nucleation of GaAs on Si Nanofacets
Prieto, Ivan, Kozak, Roksolana, Skibitzki, Oliver, Rossell, Marta D., Schroeder, Thomas, Erni, Rolf, von Känel, Hans
Published in Small (Weinheim an der Bergstrasse, Germany) (01.06.2017)
Published in Small (Weinheim an der Bergstrasse, Germany) (01.06.2017)
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Journal Article
Engineered Coalescence by Annealing 3D Ge Microstructures into High-Quality Suspended Layers on Si
Salvalaglio, Marco, Bergamaschini, Roberto, Isa, Fabio, Scaccabarozzi, Andrea, Isella, Giovanni, Backofen, Rainer, Voigt, Axel, Montalenti, Francesco, Capellini, Giovanni, Schroeder, Thomas, von Känel, Hans, Miglio, Leo
Published in ACS applied materials & interfaces (02.09.2015)
Published in ACS applied materials & interfaces (02.09.2015)
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Journal Article
Bi-modal nanoheteroepitaxy of GaAs on Si by metal organic vapor phase epitaxy
Prieto, Ivan, Kozak, Roksolana, Skibitzki, Oliver, Rossell, Marta D, Zaumseil, Peter, Capellini, Giovanni, Gini, Emilio, Kunze, Karsten, Rojas Dasilva, Yadira Arroyo, Erni, Rolf, Schroeder, Thomas, Känel, Hans von
Published in Nanotechnology (01.03.2017)
Published in Nanotechnology (01.03.2017)
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Journal Article
Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling
Meduňa, Mojmír, Falub, Claudiu Valentin, Isa, Fabio, Marzegalli, Anna, Chrastina, Daniel, Isella, Giovanni, Miglio, Leo, Dommann, Alex, von Känel, Hans
Published in Journal of applied crystallography (01.06.2016)
Published in Journal of applied crystallography (01.06.2016)
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Journal Article
A tool for automatic recognition of [110] tilt grain boundaries in zincblende‐type crystals
Kozak, Roksolana, Kurdzesau, Fiodar, Prieto, Ivan, Skibitzki, Oliver, Schroeder, Thomas, Arroyo Rojas Dasilva, Yadira, Erni, Rolf, von Känel, Hans, Rossell, Marta D.
Published in Journal of applied crystallography (01.10.2017)
Published in Journal of applied crystallography (01.10.2017)
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Journal Article
Growth and Coalescence of 3C-SiC on Si(111) Micro-Pillars by a Phase-Field Approach
Masullo, Marco, Bergamaschini, Roberto, Albani, Marco, Kreiliger, Thomas, Mauceri, Marco, Crippa, Danilo, La Via, Francesco, Montalenti, Francesco, von Känel, Hans, Miglio, Leo
Published in Materials (01.10.2019)
Published in Materials (01.10.2019)
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