On the oxide formation on stainless steels AISI 304 and incoloy 800H investigated with XPS
Langevoort, J.C., Sutherland, I., Hanekamp, L.J., Gellings, P.J.
Published in Applied surface science (01.04.1987)
Published in Applied surface science (01.04.1987)
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Journal Article
Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon
Lohner, T., Fried, M., Gyulai, J., Vedam, K., Nguyen, N.V., Hanekamp, L.J., van Silfhout, A.
Published in Thin solid films (12.10.1993)
Published in Thin solid films (12.10.1993)
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Journal Article
Conference Proceeding
Surface and bulk magnetic behaviour of sputtered CoCr films
Hemmes, K, Lisowski, W, Lodder, J C, Hanekamp, L J, Popma, Th J A
Published in Journal of physics. D, Applied physics (14.07.1986)
Published in Journal of physics. D, Applied physics (14.07.1986)
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Journal Article
In-depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS
HANEKAMP, L. J, VAN DEN BERG, A. H. J, BOUWMEESTER, H. J. M, SASSE, A. G. B. M, KRUIDHOF, H
Published in Mikrochimica acta (1966. Print) (1990)
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Published in Mikrochimica acta (1966. Print) (1990)
Conference Proceeding