EYE MARGIN TEST METHOD AND ELECTRONIC APPARATUS PERFORMING TEST OPERATION BASED ON THE SAME
KIM, Hyoungjoong, KIM, Myeongcheol, LEE, Soomin, MIN, Woongki, OH, Younggyun, HAN, Hyeonji, KIM, Sangho
Year of Publication 19.09.2024
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Year of Publication 19.09.2024
Patent
A 64Gb/s Downlink and 32Gb/s Uplink NRZ Wireline Transceiver with Supply Regulation, Background Clock Correction and EOM-based Channel Adaptation for Mid-Reach Cellular Mobile Interface in 8nm FinFET
Lee, Soo-Min, Lim, Jihoon, Jang, Jaehyuk, Kim, Hyoungjoong, Min, Kyunghwan, Min, Woongki, Han, Hyeonji, Kim, Gyusik, Kim, Jaeyoung, Kim, Chulho, Jeon, Sejun, Park, Jinhoon, Chae, Hyunsu, Han, Sangwook, Pham, Hiep, Zhao, Xingliang, Gu, Qilin, Yao, Chih-Wei, Kim, Sangho, Lee, Jongwoo
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
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