Novel Hierarchical Test Architecture for SOC Test Methodology Using IEEE Test Standards
Han, Dong-Kwan, Lee, Yong, Kang, Sung-Ho
Published in Journal of semiconductor technology and science (01.09.2012)
Published in Journal of semiconductor technology and science (01.09.2012)
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Journal Article
Temperature trajectories and mortality in hypothermic sepsis patients
Han, Dongkwan, Kang, Seung Hyun, Um, Young Woo, Kim, Hee Eun, Hwang, Ji Eun, Lee, Jae Hyuk, Jo, You Hwan, Jung, Yoon Sun, Lee, Hui Jai
Published in The American journal of emergency medicine (01.10.2024)
Published in The American journal of emergency medicine (01.10.2024)
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Journal Article
Dynamic Changes in Soluble Triggering Receptor Expressed on Myeloid Cells-I in Sepsis with Respect to Antibiotic Susceptibility
Um, Young Woo, Park, Inwon, Lee, Jae Hyuk, Kim, Hee Eun, Han, Dongkwan, Kang, Seung Hyun, Kim, Seonghye, Jo, You Hwan
Published in Infection and drug resistance (30.06.2024)
Published in Infection and drug resistance (30.06.2024)
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Journal Article
Prolonged stay in the emergency department is an independent risk factor for hospital‐acquired pressure ulcer
Han, Dongkwan, Kang, Bora, Kim, Joonghee, Jo, You Hwan, Lee, Jae Hyuk, Hwang, Ji Eun, Park, Inwon, Jang, Dong‐Hyun
Published in International wound journal (01.04.2020)
Published in International wound journal (01.04.2020)
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Journal Article
DEVICE FOR FIXING BUCKET FOR TRANSFERRING COKE
LEE CHANGYOUP, JU YOUNGIL, HAN DONGKWAN, KIM WOOSUNG, KIM JIHO, OAK MYUNGWOO
Year of Publication 12.04.2023
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Year of Publication 12.04.2023
Patent
Dynamic Changes in Soluble Triggering Receptor Expressed on Myeloid Cells-1 in Sepsis with Respect to Antibiotic Susceptibility
Um, Young Woo, Park, Inwon, Lee, Jae Hyuk, Kim, Hee Eun, Han, Dongkwan, Kang, Seung Hyun, Kim, Seonghye, Jo, You Hwan
Published in Infection and drug resistance (01.01.2024)
Published in Infection and drug resistance (01.01.2024)
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Journal Article
Test Compression Improvement with EDT Channel Sharing in SoC Designs
Yu Huang, Kassab, Mark, Jahangiri, Jay, Rajski, Janusz, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung
Published in 2014 IEEE 23rd North Atlantic Test Workshop (01.05.2014)
Published in 2014 IEEE 23rd North Atlantic Test Workshop (01.05.2014)
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Conference Proceeding