by Hamdioui, S, Vaivre-Douret, L
Published in European psychiatry (01.08.2024)

by Hamdioui, S., Vaivre-Douret, L.
Published in European psychiatry (01.03.2023)

by Hamdioui, S., Vaivre-Douret, L.
Published in European psychiatry (01.06.2022)

by Hamdioui, S., Vaivre-Douret, L.
Published in European psychiatry (01.04.2021)

by Vaivre-Douret, L., Hamdioui, S.
Published in European psychiatry (01.04.2021)

by Copetti, T. S., Fieback, M., Gemmeke, T., Hamdioui, S., Poehls, L. M. Bolzani
Published in Journal of electronic testing (01.04.2024)

by Aziza, H., Moreau, M., Fieback, M., Taouil, M., Hamdioui, S.
Published in IEEE access (2020)

by Aziza, H., Hamdioui, S., Fieback, M., Taouil, M., Moreau, M.
Published in 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.02.2021)

by Poehls, L. M. Bolzani, Fieback, M. C. R., Hoffmann-Eifert, S., Copetti, T., Brum, E., Menzel, S., Hamdioui, S., Gemmeke, T.
Published in Journal of electronic testing (01.08.2021)

by Yuan, S., Zhang, Z., Fieback, M., Xun, H., Marinissen, E. J., Kar, G. S., Rao, S., Couet, S., Taouil, M., Hamdioui, S.
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)

by Bosio, A., Hamdioui, S., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., Di Natale, G., Anghel, L., Nagarajan, S., R. Fieback, M. C.
Published in 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2019)

by Jenihhin, M., Hamdioui, S., Reorda, M. Sonza, Krstic, M., Langendorfer, P., Sauer, C., Klotz, A., Huebner, M., Nolte, J., Vierhaus, H. T., Selimis, G., Alexandrescu, D., Taouil, M., Schrijen, G. J., Raik, J., Sterpone, L., Squillero, G., Dyka, Z.
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)

by Hamdioui, S., Al-Ars, Z., van de Goor, A.J.
Published in IEEE transactions on computers (01.12.2006)

by Al-Ars, Z., Hamdioui, S., Gaydadjiev, G., Vassiliadis, S.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2008)

by Hamdioui, S., Reyes, J.E.Q.D.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2005)

by Hamdioui, S., Al-Ars, Z., van de Goor, A.J., Rodgers, M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.05.2004)

by Hamdioui, S., van de Goor, A.J., Rodgers, M.
Published in Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) (2002)

by Aziza, H., Postel-Pellerin, J., Fieback, M., Hamdioui, S., Xun, H., Taouil, M., Coulie, K., Rahajandraibe, W.
Published in 2024 IEEE 25th Latin American Test Symposium (LATS) (09.04.2024)

by Copetti, T. S., Chordia, A., Fieback, M., Taouil, M., Hamdioui, S., Bolzani Poehls, L. M.
Published in 2024 IEEE 25th Latin American Test Symposium (LATS) (09.04.2024)

by Hamdioui, S., Van De Goor, A.J.
Published in Proceedings - Asian Test Symposium (2000)