Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip
Hamalainen, Roni, Lunnikivi, Henri, Hamalainen, Timo
Published in 2023 IEEE Nordic Circuits and Systems Conference (NorCAS) (31.10.2023)
Published in 2023 IEEE Nordic Circuits and Systems Conference (NorCAS) (31.10.2023)
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