An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam
Halpin, J.E., Webster, R.W.H., Gardner, H., Moody, M.P., Bagot, P.A.J., MacLaren, D.A.
Published in Ultramicroscopy (01.07.2019)
Published in Ultramicroscopy (01.07.2019)
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Journal Article
Suppression of thermal conductivity without impeding electron mobility in n-type XNiSn half-Heusler thermoelectrics
Barczak, S. A, Quinn, R. J, Halpin, J. E, Domosud, K, Smith, R. I, Baker, A. R, Don, E, Forbes, I, Refson, K, MacLaren, D. A, Bos, J. W. G
Published in Journal of materials chemistry. A, Materials for energy and sustainability (2019)
Published in Journal of materials chemistry. A, Materials for energy and sustainability (2019)
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Journal Article
Electrical properties and strain distribution of Ge suspended structures
Shah, V.A., Rhead, S.D., Finch, J., Myronov, M., Reparaz, J.S., Morris, R.J., Wilson, N.R., Kachkanov, V., Dolbnya, I.P., Halpin, J.E., Patchett, D., Allred, P., Colston, G., Sawhney, K.J.S., Sotomayor Torres, C.M., Leadley, D.R.
Published in Solid-state electronics (01.06.2015)
Published in Solid-state electronics (01.06.2015)
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Journal Article
Flat single crystal Ge membranes for sensors and opto-electronic integrated circuitry
Shah, V.A., Myronov, M., Rhead, S.D., Halpin, J.E., Shchepetov, A., Prest, M.J., Prunnila, M., Whall, T.E., Parker, E.H.C., Leadley, D.R.
Published in Solid-state electronics (01.08.2014)
Published in Solid-state electronics (01.08.2014)
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Journal Article