Dielectric function representation by B-splines
Johs, Blaine, Hale, Jeffrey S.
Published in Physica status solidi. A, Applications and materials science (01.04.2008)
Published in Physica status solidi. A, Applications and materials science (01.04.2008)
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Journal Article
Conference Proceeding
Spectroscopic ellipsometry characterization of multilayer optical coatings
Hilfiker, James N., Pribil, Greg K., Synowicki, Ron, Martin, Andrew C., Hale, Jeffrey S.
Published in Surface & coatings technology (15.01.2019)
Published in Surface & coatings technology (15.01.2019)
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Journal Article
파장 수정자를 포함하는 반사계, 분광 광도계, 엘립소미터, 및 편광계 시스템
HE PING, VAN DERSLICE JEREMY A, HERZINGER CRAIG M, WELCH JAMES D, LIPHARDT MARTIN M, MEYER DUANE E, HALE JEFFREY S, GUENTHER BRIAN D, SCHOECHE STEFAN
Year of Publication 19.09.2023
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Year of Publication 19.09.2023
Patent
Visible and infrared optical constants of electrochromic materials for emissivity modulation applications
Hale, Jeffrey S., DeVries, Michael, Dworak, Brad, Woollam, John A.
Published in Thin solid films (01.02.1998)
Published in Thin solid films (01.02.1998)
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Journal Article
Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry
Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, Chantel
Published in Applied surface science (01.11.2017)
Published in Applied surface science (01.11.2017)
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Journal Article
Estimating Depolarization with the Jones Matrix Quality Factor
Hilfiker, James N., Hale, Jeffrey S., Herzinger, Craig M., Tiwald, Tom, Hong, Nina, Schöche, Stefan, Arwin, Hans
Published in Applied surface science (01.11.2017)
Published in Applied surface science (01.11.2017)
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Journal Article
Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry
Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, Chantel
Published in Applied surface science (01.11.2017)
Published in Applied surface science (01.11.2017)
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Journal Article
Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment
Woollam, John A., Synowicki, R.A., Hale, Jeffrey S., Ianno, N.J., Spady, Blaine L., Moore, Arthur W., Hambourger, Paul
Published in Thin solid films (01.04.1994)
Published in Thin solid films (01.04.1994)
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Journal Article
Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations
Jie Chen, Koirala, P., Salupo, C., Collins, R. W., Marsillac, S., Kormanyos, K. R., Johs, B. D., Hale, J. S., Pfeiffer, G. L.
Published in 2012 38th IEEE Photovoltaic Specialists Conference (01.06.2012)
Published in 2012 38th IEEE Photovoltaic Specialists Conference (01.06.2012)
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Conference Proceeding
Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide
Trimble, Chris, DeVries, Michael, Hale, Jeffrey S., Thompson, Daniel W., Tiwald, Thomas E., Woollam, John A.
Published in Thin solid films (01.11.1999)
Published in Thin solid films (01.11.1999)
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Journal Article
REFLECTOMETER, SPECTROPHOTOMETER, ELLIPSOMETER AND POLARIMETER SYSTEMS INCLUDING A WAVELENGTH MODIFIER
HALE, Jeffrey S, SCHOECHE, Stefan, MEYER, Duane E, HERZINGER, Craig M, LIPHARDT, Martin M, HE, Ping, VAN DERSLICE, Jeremy A, WELCH, James D, GUENTHER, Brian D
Year of Publication 06.12.2023
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Year of Publication 06.12.2023
Patent
Beam focusing and reflective optics
He, Ping, Liphardt, Martin M, Hale, Jeffrey S, Herzinger, Craig M, Pfeiffer, Galen L
Year of Publication 27.04.2021
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Year of Publication 27.04.2021
Patent
REFLECTOMETER, SPECTROPHOTOMETER, ELLIPSOMETER AND POLARIMETER SYSTEMS INCLUDING A WAVELENGTH MODIFIER
HALE, Jeffrey S, SCHOECHE, Stefan, MEYER, Duane E, HERZINGER, Craig M, LIPHARDT, Martin M, HE, Ping, VAN DERSLICE, Jeremy A, WELCH, James D, GUENTHER, Brian D
Year of Publication 15.09.2022
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Year of Publication 15.09.2022
Patent
Reflectometer, spectrophotometer, ellipsometer and polarimeter systems including a wavelength modifier
He, Ping, Schoeche, Stefan, Welch, James D, Meyer, Duane E, Van Derslice, Jeremy A, Guenther, Brian D, Liphardt, Martin M, Hale, Jeffrey S, Herzinger, Craig M
Year of Publication 04.08.2022
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Year of Publication 04.08.2022
Patent
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system
He, Ping, Schoeche, Stefan, Welch, James D, Meyer, Duane E, Van Derslice, Jeremy A, Guenther, Brian D, Liphardt, Martin M, Hale, Jeffrey S, Herzinger, Craig M, Woollam, John A
Year of Publication 13.06.2023
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Year of Publication 13.06.2023
Patent