by Hailstone, R. K, DiFrancesco, A. G, Leong, J. G, Allston, T. D, Reed, K. J
Published in Journal of physical chemistry. C (27.08.2009)

by Hailstone, R. K., DiFrancesco, A. G., Allston, T. D., Parsiegla, K., Reed, K. J.
Published in Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology (01.03.2014)

by Augustyn, C. L., Allston, T. D., Hailstone, R. K., Reed, K. J.
Published in RSC advances (2014)

by Hailstone, R. K, De Keyzer, R
Published in The journal of physical chemistry. B (09.08.2001)

by Hailstone, R. K
Published in Journal of physical chemistry (1952) (01.03.1995)

by Hailstone, R K, French, J, De Keyzer, R
Published in The imaging science journal (01.01.2003)

by Hailstone, R K, French, J, De Keyzer, R
Published in The imaging science journal (01.01.2003)

by Hailstone, R K
Published in The imaging science journal (01.01.2001)

by Hailstone, R K, French, J, De Keyzer, R
Published in The imaging science journal (01.01.2003)

by Hailstone, R K, French, J, Tan, J, De Keyzer, R
Published in The imaging science journal (01.01.2003)

by Tan, J, Hailstone, R K, De Keyzer, R
Published in The imaging science journal (01.01.2003)

by Tan, J, Hailstone, R K
Published in The imaging science journal (01.12.2004)

by Hailstone, R K, French, J, De Keyzer, R
Published in The imaging science journal (01.09.2004)

by Hailstone, R K, De Keyzer, R A
Published in The imaging science journal (01.09.2004)

by Hailstone, R K, Heieck, J
Published in Journal of physics. D, Applied physics (14.02.1995)

by Zheng, J P, DiFrancesco, A G, Hailstone, R K, Callant, P, De Keyzer, R
Published in The imaging science journal (01.01.2003)

by Tan, J, Dai, J, DiFrancesco, A G, Hailstone, R K
Published in The imaging science journal (01.01.2001)

by Zheng, J P, DiFrancesco, A G, Hailstone, R K, Callant, P, De Keyzer, R
Published in The imaging science journal (01.01.2002)

by Hailstone, R. K.
Published in Journal of applied physics (01.08.1999)

by Hailstone, RK, DiFrancesco, AG, Reed, KJ
Published in Microscopy and microanalysis (01.07.2009)