Thermal magnetic field noise limits resolution in transmission electron microscopy
Uhlemann, Stephan, Müller, Heiko, Hartel, Peter, Zach, Joachim, Haider, Max
Published in Physical review letters (22.07.2013)
Published in Physical review letters (22.07.2013)
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Journal Article
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV
Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Haider, Max, Niestadt, Marcel, Bischoff, Maarten, Biskupek, Johannes, Lee, Zhongbo, Lehnert, Tibor, Börrnert, Felix, Rose, Harald, Kaiser, Ute
Published in Physical review letters (12.08.2016)
Published in Physical review letters (12.08.2016)
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Journal Article
Thermal magnetic field noise: Electron optics and decoherence
Uhlemann, Stephan, Müller, Heiko, Zach, Joachim, Haider, Max
Published in Ultramicroscopy (01.04.2015)
Published in Ultramicroscopy (01.04.2015)
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Journal Article
Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy
Watanabe, Masashi, Guzzinati, Giulio, Gerheim, Volker, Linck, Martin, Müller, Heiko, Haider, Max, Isabell, Thomas, Sawada, Hidetaka
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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Journal Article
Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope
Watanabe, Masashi, Guzzinati, Giulio, Kükelhan, Pirmin, Gerheim, Volker, Linck, Martin, Müller, Heiko, Haider, Max, Hoffman, Thomas F, Isabell, Thomas, Shimura, Naoki, Sawada, Hidetaka
Published in Microscopy and microanalysis (22.07.2023)
Published in Microscopy and microanalysis (22.07.2023)
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Journal Article
On the Benefit of Aberration Correction in Cryo Electron Microscopy
Linck, Martin, Müller, Heiko, Hartel, Peter, Perl, Svenja, Uhlemann, Stephan, Haider, Max
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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Journal Article
Corrigendum to: “A flexible multi-stimuli in-situ (S)TEM: Concept and optical performance” [Ultramicroscopy 151 (2015) 31–36]
Börrnert, Felix, Müller, Heiko, Riedel, Thomas, Linck, Martin, Kirkland, Angus I., Haider, Max, Büchner, Bernd, Lichte, Hannes
Published in Ultramicroscopy (01.11.2017)
Published in Ultramicroscopy (01.11.2017)
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Journal Article
On Proper Phase Contrast Imaging in Aberration Corrected TEM
Hartel, Peter, Linck, Martin, Kahl, Frank, Müller, Heiko, Haider, Max
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Overview of Commercially Available CEOS Hexapole-type Aberration Correctors
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Max
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Towards High Resolution in TEM and STEM: What are the Limitations and Achievements
Haider, Max, Uhlemann, Stephan, Hartel, Peter, Müller, Heiko
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
A spherical-aberration-corrected 200kV transmission electron microscope
Haider, Max, Rose, Harald, Uhlemann, Stephan, Schwan, Eugen, Kabius, Bernd, Urban, Knut
Published in Ultramicroscopy (01.10.1998)
Published in Ultramicroscopy (01.10.1998)
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Journal Article
A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook
Börrnert, Felix, Müller, Heiko, Riedel, Thomas, Linck, Martin, Kirkland, Angus I., Haider, Max, Büchner, Bernd, Lichte, Hannes
Published in Ultramicroscopy (01.04.2015)
Published in Ultramicroscopy (01.04.2015)
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Journal Article
Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Biskupek, Johannes, Niestadt, Marcel, Kaiser, Ute, Haider, Max
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
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Journal Article
Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations
Lee, Zhongbo, Biskupek, Johannes, Lehnert, Tibor, Rose, Harald, Linck, Martin, Hartel, Peter, Müller, Heiko, Haider, Max, Kaiser, Ute
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
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Journal Article
A spherical-aberration-corrected 200 kV transmission electron microscope
Haider, Max, Rose, Harald, Uhlemann, Stephan, Schwan, Eugen, Kabius, Bernd, Urban, Knut
Published in Ultramicroscopy (01.10.1998)
Published in Ultramicroscopy (01.10.1998)
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Journal Article
Electron Holography with Cs-corrected TEM
Lichte, Hannes, Geiger, Dorin, Lehmann, Michael, Haider, Max, Freitag, Bert
Published in Microscopy and microanalysis (01.08.2004)
Published in Microscopy and microanalysis (01.08.2004)
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Journal Article