Crystallization and microstructure-dependent elastic moduli of ferroelectric P(VDF-TrFE) thin filmsElectronic supplementary information (ESI) available: S1) Crystalline morphology of P(VDF-TrFE) thin films on various substrates at low temperatures. S2) Buckling wavelengths of P(VDF-TrFE) thin films, prepared and annealed on FSAM-treated Si substrate (a) and on PDMS (b). S3) Tabulated moduli values of P(VDF-TrFE) thin films, with % crystallinity data from the literature. S4) Elastic moduli and %
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Journal Article
Buckling-based measurements of mechanical moduli of thin films
Hahm, Si-Woo, Hwang, Hyun-Sik, Kim, Donyoung, Khang, Dahl-Young
Published in Electronic materials letters (01.12.2009)
Published in Electronic materials letters (01.12.2009)
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Journal Article