The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements
Hadzi-Vukovic, J., Jevtic, M., Glavanovics, M., Rothleitner, H.
Published in Physica status solidi. A, Applications and materials science (01.11.2008)
Published in Physica status solidi. A, Applications and materials science (01.11.2008)
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Journal Article
Conference Proceeding
Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets
Jevtic, M M, Hadzi-Vukovic, J
Published in Journal of Optoelectronics and Advanced Materials (01.02.2009)
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Published in Journal of Optoelectronics and Advanced Materials (01.02.2009)
Journal Article
Diagnostics of GaAs HEMT based on noise measurements
Jevtic, M M, Hadzi-Vukovic, J
Published in Journal of Optoelectronics and Advanced Materials (01.11.2007)
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Published in Journal of Optoelectronics and Advanced Materials (01.11.2007)
Journal Article
A novel analytical model of a SiC MOSFET
Ramovic, R., Jevtic, M., Hadzi-Vukovic, J., Randjelovic, D.
Published in 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) (2002)
Published in 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) (2002)
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Conference Proceeding
Schottky diode in HV CMOS smart power technology and its demonstration for charge pump application
Hadzi-Vukovic, J., Jevtic, M., Rothleitner, H., Del Croce, P., Ladurner, M., Wachter, F.
Published in CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005 (2005)
Published in CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005 (2005)
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Conference Proceeding
Configurable High Side Power Switch in Smart Power Technology
Del Croce, P., Hadzi-Vukovic, J., Meldt, B., Ladurner, M.
Published in 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems (01.06.2007)
Published in 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems (01.06.2007)
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Conference Proceeding
Low Frequency Noise of GaAs MESFET Degraded in ESD Test
Jevtic, M.M., Hadzi-Vukovic, J.
Published in 2006 25th International Conference on Microelectronics (2006)
Published in 2006 25th International Conference on Microelectronics (2006)
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Conference Proceeding