by Bender, M., Otto, M., Hadam, B., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (01.07.2002)

by Bender, M., Otto, M., Hadam, B., Vratzov, B., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (01.06.2000)

by Otto, M., Bender, M., Hadam, B., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (01.09.2001)

by Albuschies, J., Baus, M., Winkler, O., Hadam, B., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (01.04.2006)

by OTTO, M, BENDER, M, RICHTER, F, HADAM, B, KLIEM, T, JEDE, R, SPANGENBERG, B, KURZ, H
Published in Microelectronic engineering (01.06.2004)

by Otto, M., Bender, M., Richter, F., Hadam, B., Kliem, T., Jede, R., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (01.06.2004)

by Winkler, O., Merget, F., Heuser, M., Hadam, B., Baus, M., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (01.07.2002)

by Music, D., Kölpin, H., Atiser, A., Kreissig, U., Bobek, T., Hadam, B., Schneider, J.M.
Published in Materials research bulletin (11.08.2005)

by Heuser, M., Baus, M., Hadam, B., Winkler, O., Spangenberg, B., Granzner, R., Lemme, M., Kurz, H.
Published in Microelectronic engineering (01.07.2002)

by GÖTZ, D, HADAM, B, IDINK, H, HAHN, T, GÖBBELS, M, WOERMANN, E
Published in Physica. C, Superconductivity (10.02.1995)

by Brunner, J., Schittenhelm, P., Gondermann, J., Spangenberg, B., Hadam, B., Köster, T., Roskos, H.G., Kurz, H., Gossner, H., Eisele, I., Abstreiter, G.
Published in Journal of crystal growth (01.05.1995)

by Gondermann, J., Schiepanski, J., Hadam, B., Köster, T., Röwer, T., Stein, J., Spangenberg, B., Roskos, H., Kurz, H.
Published in Microelectronic engineering (01.02.1997)

by Barth, R., Hamidi, A.H., Hadam, B., Hollkott, J., Dunkmann, D., Auge, J., Kurz, H.
Published in Microelectronic engineering (01.01.1996)

by Köster, T., Hadam, B., Goldschmidtböing, F., Hofmann, K., Gondermann, J., Stein, J., Hu, S., Altmeyer, S., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (1998)

by Köster, T., Stein, J., Hadam, B., Gondermann, J., Spangenberg, B., Roskos, H.G., Kurz, H., Holzmann, M., Riedinger, M., Abstreiter, G.
Published in Microelectronic engineering (01.02.1997)

by Brunner, J., Jung, W., Schittenhelm, P., Gail, M., Abstreiter, G., Gonderman, J., Hadam, B., Koester, T., Spangenberg, B., Roskos, H.G., Kurz, H., Gossner, H., Eisele, I.
Published in Journal of crystal growth (01.12.1995)

by KÖSTER, T, HADAM, B, GONDERMANN, J, SPANGENBERG, B, ROSKOS, H. G, KURZ, H, BRUNNER, J, ABSTREITER, G
Published in Microelectronic engineering (1996)

by Gondermann, J., Spangenberg, B., Ko¨ster, T., Hadam, B., Roskos, H.G., Kurz, H., Brunner, J., Schittenhelm, P., Abstreiter, G., Goßner, H., Eisele, I.
Published in Microelectronic engineering (01.02.1995)

by Baus, M., Szafranek, B.N., Chmielus, S., Lemme, M.C., Hadam, B., Spangenberg, B., Sittig, R., Kurz, H.
Published in 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (2006)

by Koester, Thomas, Goldschmidtboeing, Frank, Hadam, Birgit, Stein, Josef, Altmeyer, Stefan, Spangenberg, Bernd, Kurz, Heinrich, Neumann, Robert, Brunner, Karl, Abstreiter, Gerd
Published in Japanese Journal of Applied Physics (01.01.1999)