Quantified density of performance-degrading near-interface traps in SiC MOSFETs
Chaturvedi, Mayank, Dimitrijev, Sima, Haasmann, Daniel, Moghadam, Hamid Amini, Pande, Peyush, Jadli, Utkarsh
Published in Scientific reports (08.03.2022)
Published in Scientific reports (08.03.2022)
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Journal Article
Transient-Current Method for Measurement of Active Near-Interface Oxide Traps in 4H-SiC MOS Capacitors and MOSFETs
Moghadam, Hamid Amini, Dimitrijev, Sima, Jisheng Han, Haasmann, Daniel, Aminbeidokhti, Amirhossein
Published in IEEE transactions on electron devices (01.08.2015)
Published in IEEE transactions on electron devices (01.08.2015)
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Journal Article
Active defects in MOS devices on 4H-SiC: A critical review
Amini Moghadam, Hamid, Dimitrijev, Sima, Han, Jisheng, Haasmann, Daniel
Published in Microelectronics and reliability (01.05.2016)
Published in Microelectronics and reliability (01.05.2016)
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Journal Article
Observations of very fast electron traps at SiC/high-κ dielectric interfaces
Vidarsson, Arnar M., Persson, Axel R., Chen, Jr-Tai, Haasmann, Daniel, Hassan, Jawad Ul, Dimitrijev, Sima, Rorsman, Niklas, Darakchieva, Vanya, Sveinbjörnsson, Einar Ö.
Published in APL materials (01.11.2023)
Published in APL materials (01.11.2023)
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Journal Article
Direct Measurement of Active Near-Interface Traps in the Strong-Accumulation Region of 4H-SiC MOS Capacitors
Pande, Peyush, Dimitrijev, Sima, Haasmann, Daniel, Amini Moghadam, Hamid, Tanner, Philip, Han, Jisheng
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
Mechanisms of negative bias instability of commercial SiC MOSFETs observed by current transients
Chaturvedi, Mayank, Haasmann, Daniel, Tanner, Philip, Dimitrijev, Sima
Published in Solid-state electronics (01.05.2024)
Published in Solid-state electronics (01.05.2024)
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Journal Article
Comparison of Commercial Planar and Trench SiC MOSFETs by Electrical Characterization of Performance-Degrading Near-Interface Traps
Chaturvedi, Mayank, Dimitrijev, Sima, Haasmann, Daniel, Moghadam, Hamid Amini, Pande, Peyush, Jadli, Utkarsh
Published in IEEE transactions on electron devices (01.11.2022)
Published in IEEE transactions on electron devices (01.11.2022)
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Journal Article
Detection of near-interface traps in NO annealed 4H-SiC metal oxide semiconductor capacitors combining different electrical characterization methods
Vidarsson, Arnar M., Nicholls, Jordan R., Haasmann, Daniel, Dimitrijev, Sima, Sveinbjörnsson, Einar Ö.
Published in Journal of applied physics (07.06.2022)
Published in Journal of applied physics (07.06.2022)
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Journal Article
Electrical characterization of SiC MOS capacitors: A critical review
Pande, Peyush, Haasmann, Daniel, Han, Jisheng, Moghadam, Hamid Amini, Tanner, Philip, Dimitrijev, Sima
Published in Microelectronics and reliability (01.09.2020)
Published in Microelectronics and reliability (01.09.2020)
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Journal Article
Impact of nitridation on the active near-interface traps in gate oxides on 4H-SiC
Pande, Peyush, Dimitrijev, Sima, Haasmann, Daniel, Moghadam, Hamid Amini, Chaturvedi, Mayank, Jadli, Utkarsh
Published in Solid-state electronics (01.09.2020)
Published in Solid-state electronics (01.09.2020)
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Journal Article
Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides
Nicholls, Jordan R., Vidarsson, Arnar M., Haasmann, Daniel, Sveinbjornsson, Einar O., Dimitrijev, Sima
Published in IEEE transactions on electron devices (01.09.2020)
Published in IEEE transactions on electron devices (01.09.2020)
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Journal Article
A method for characterizing near-interface traps in SiC metal–oxide–semiconductor capacitors from conductance–temperature spectroscopy measurements
Nicholls, Jordan R., Vidarsson, Arnar M., Haasmann, Daniel, Sveinbjörnsson, Einar Ö., Dimitrijev, Sima
Published in Journal of applied physics (07.02.2021)
Published in Journal of applied physics (07.02.2021)
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Journal Article
Integrated, Transparent Silicon Carbide Electronics and Sensors for Radio Frequency Biomedical Therapy
Nguyen, Tuan-Khoa, Yadav, Sharda, Truong, Thanh-An, Han, Mengdi, Barton, Matthew, Leitch, Michael, Guzman, Pablo, Dinh, Toan, Ashok, Aditya, Vu, Hieu, Dau, Van, Haasmann, Daniel, Chen, Lin, Park, Yoonseok, Do, Thanh Nho, Yamauchi, Yusuke, Rogers, John A., Nguyen, Nam-Trung, Phan, Hoang-Phuong
Published in ACS nano (26.07.2022)
Published in ACS nano (26.07.2022)
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Journal Article
Energy-Localized Near-Interface Traps Active in the Strong-Accumulation Region of 4H-SiC MOS Capacitors
Pande, Peyush, Dimitrijev, Sima, Haasmann, Daniel, Amini Moghadam, Hamid, Tanner, Philip, Han, Jisheng
Published in IEEE transactions on electron devices (01.04.2019)
Published in IEEE transactions on electron devices (01.04.2019)
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Journal Article