Calibration and assay development using the four-parameter logistic model
O'Connell, M.A., Belanger, B.A., Haaland, P.D.
Published in Chemometrics and intelligent laboratory systems (01.09.1993)
Published in Chemometrics and intelligent laboratory systems (01.09.1993)
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Journal Article
Ionization of trimethylsilane, (CH 3) 3SiH
Jiao, C.Q, Garscadden, A, Haaland, P.D
Published in International journal of mass spectrometry (1999)
Published in International journal of mass spectrometry (1999)
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Journal Article
Ion chemistry in tetraethylorthosilicate (C2H5O)4Si
Holtgrave, J., Riehl, K., Abner, D., Haaland, P.D.
Published in Chemical physics letters (17.12.1993)
Published in Chemical physics letters (17.12.1993)
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Journal Article
Ion chemistry in tetraethylorthosilicate (C 2 H 5 O) 4 Si
Holtgrave, J., Riehl, K., Abner, D., Haaland, P.D.
Published in Chemical physics letters (01.12.1993)
Published in Chemical physics letters (01.12.1993)
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Journal Article
Double and triple layers in dusty plasmas
Garscadden, A., Gaguly, B.N., Blezinger, P., Haaland, P.d.
Published in IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science (1997)
Published in IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science (1997)
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