Circuit and Physical Design Implementation of the Microprocessor Chip for the zEnterprise System
Warnock, J., Yiu-Hing Chan, Carey, S., Huajun Wen, Meaney, P., Gerwig, G., Smith, H. H., Yuen Chan, Davis, J., Bunce, P., Pelella, A., Rodko, D., Patel, P., Strach, T., Malone, D., Malgioglio, F., Neves, J., Rude, D. L., Huott, W.
Published in IEEE journal of solid-state circuits (01.01.2012)
Published in IEEE journal of solid-state circuits (01.01.2012)
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Journal Article
Conference Proceeding
Testing the 400 MHz IBM generation-4 CMOS chip
Foote, T.G., Hoffman, D.E., Huott, W.V., Koprowski, T.J., Robbins, B.J., Kusko, M.P.
Published in Proceedings - International Test Conference (1997)
Published in Proceedings - International Test Conference (1997)
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Conference Proceeding
Journal Article
Case Study of Advanced Diagnostic Techniques for Multi Port Register File
Srinivasan, Uma, Huott, William, Adams, Chad, Freiburger, Pete, Stellari, Franco, Song, Peilin, Tran, Phong, Albert, Dave
Published in 2019 IEEE 28th North Atlantic Test Workshop (NATW) (01.05.2019)
Published in 2019 IEEE 28th North Atlantic Test Workshop (NATW) (01.05.2019)
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Conference Proceeding
Testing bit write operation to a memory array in integrated circuits
Rodko, Daniel, Hyde, Matthew Steven, Huott, William V, Srinivasan, Uma, Knips, Thomas J
Year of Publication 23.05.2023
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Year of Publication 23.05.2023
Patent
TESTING BIT WRITE OPERATION TO A MEMORY ARRAY IN INTEGRATED CIRCUITS
HYDE, Matthew Steven, RODKO, Daniel, SRINIVASAN, Uma, HUOTT, William V, KNIPS, Thomas J
Year of Publication 23.03.2023
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Year of Publication 23.03.2023
Patent
Testing the IBM Power 7™ 4 GHz eight core microprocessor
Crafts, J, Bogdan, D, Conti, D, Forlenza, D, Forlenza, O, Huott, W, Kusko, M, Seymour, E, Taylor, T, Walsh, B
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
WORKLOAD AWARE EXERCISER DEVICE PLACEMENT
Cichanowski, Mark, Romain, Michael, LaLima, Lucas Dane, GEVA, OFER, Surprise, Jesse Peter, Huott, William V, Berry, Christopher Joseph, Owczarczyk, Pawel, Herkel, Eduard, Greene, Michael, Buyuktosunoglu, Alper
Year of Publication 14.03.2024
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Year of Publication 14.03.2024
Patent
Testing the 500-MHz IBM S/390 microprocessor
Foote, T.G., Hoffman, D.E., Huott, W.V., Koprowski, T.J., Kusko, M.P., Robbins, B.J.
Published in IEEE design & test of computers (01.07.1998)
Published in IEEE design & test of computers (01.07.1998)
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Journal Article
Method to limit the time a semiconductor device operates above a maximum operating voltage
Collura, Adam Benjamin, Cichanowski, Mark, Romain, Michael, Huott, William V, Buyuktosunoglu, Alper, Webel, Tobias, Jacobi, Christian, Saporito, Anthony, Cadigan, Jr., Michael Joseph, Owczarczyk, Pawel, Carey, Sean Michael, Payer, Stefan, Anderson, Karl Evan Smock, Logsdon, Paul Jacob, Shum, Chung-Lung K
Year of Publication 14.11.2023
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Year of Publication 14.11.2023
Patent
OPERATING VOLTAGE OF A SEMICONDUCTOR DEVICE
OWCZARCZYK, Pawel, CADIGAN JR., Michael, CICHANOWSKI, Mark, COLLURA, Adam, ROMAIN, Michael, BUYUKTOSUNOGLU, Alper, CAREY, Sean, WEBEL, Tobias, LOGSDON, Paul, JACOBI, Christian, ANDERSON, Karl, SHUM, Chung-Lung, HUOTT, William, PAYER, Stefan, SAPORITO, Anthony
Year of Publication 12.10.2023
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Year of Publication 12.10.2023
Patent
Microchip level shared array repair
Peterson, Kirk D, DeForge, John B, Kim, Hyong Uk, Rodko, Daniel, Huott, William V, Srinivasan, Uma, Meehan, Timothy, Finnefrock, Michelle E
Year of Publication 04.10.2022
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Year of Publication 04.10.2022
Patent