Showing
1 - 18
results of
18
for search '
"HUNG; YAU Y"
'
Skip to content
Portal K.UTB
Čeština
Login
TBU Catalog
e-resources
E-THESES
All Fields
Title
Author
Subject
Find
Advanced Search
Search Results - "HUNG; YAU Y"
Showing
1 - 18
results of
18
for search '
"HUNG; YAU Y"
'
, query time: 1.03s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
1
Loading…
Fast profilometer for the automatic measurement of 3-D object shapes
by
Tang, S
,
Hung, Y Y
Published in
Applied optics (2004)
(10.07.1990)
Get more information
Journal Article
Save to List
Saved in:
2
Loading…
Nondestructive testing of diffusely reflective objects
by
HUNG YAU Y
Year of Publication
12.08.2003
Get full text
Patent
Save to List
Saved in:
3
Loading…
Nondestructive testing of diffusely reflective objects
by
Hung
,
Yau Y
Year of Publication
12.08.2003
Get full text
Patent
Save to List
Saved in:
4
Loading…
APPARATUS AND METHOD FOR ELECTRONIC ANALYSIS OF TEST OBJECTS
by
HUNG
,
YAU Y
Year of Publication
07.09.1993
Get full text
Patent
Save to List
Saved in:
5
Loading…
APPARAT UND VERFAHREN ZUR ELEKTRONISCHEN ANALYSE VON PROBEN
by
HUNG
,
YAU Y
Year of Publication
15.06.1993
Get full text
Patent
Save to List
Saved in:
6
Loading…
APPARATUS AND METHOD FOR ELECTRONIC ANALYSIS OF TEST OBJECTS
by
HUNG
,
YAU Y
Year of Publication
19.05.1993
Get full text
Patent
Save to List
Saved in:
7
Loading…
Method of measuring displacement between points on a test object
by
HUNG
;
YAU Y
Year of Publication
30.04.1991
Get full text
Patent
Save to List
Saved in:
8
Loading…
A speckle-shearing interferometer: A tool for measuring derivatives of surface displacements
by
Hung
,
Yau Y
.
Published in
Optics communications
(01.01.1974)
Get full text
Journal Article
Save to List
Saved in:
9
Loading…
Dual-lens shearing interferometer
by
HUNG
;
YAU Y
Year of Publication
02.04.1991
Get full text
Patent
Save to List
Saved in:
10
Loading…
APPARATUS AND METHOD FOR ELECTRONIC ANALYSIS OF TEST OBJECTS
by
HUNG
,
YAU Y
Year of Publication
12.09.1990
Get full text
Patent
Save to List
Saved in:
11
Loading…
Apparatus and method for electronic analysis of test objects
by
HUNG
;
YAU Y
Year of Publication
19.12.1989
Get full text
Patent
Save to List
Saved in:
12
Loading…
Apparatus and method for electronic analysis of test objects
by
HUNG
,
YAU Y
Year of Publication
14.06.1989
Get full text
Patent
Save to List
Saved in:
13
Loading…
Interferometric deformation analysis system
by
HASKELL; RICHARD E
,
HUNG
;
YAU Y
Year of Publication
28.10.1986
Get full text
Patent
Save to List
Saved in:
14
Loading…
METHOD AND APPARATUS FOR INTERFEROMETRIC DEFORMATION ANALYSIS
by
GRANT, RALPH M
,
HUNG
,
YAU Y
Year of Publication
24.11.1981
Get full text
Patent
Save to List
Saved in:
15
Loading…
Apparat und Verfahren zur elektronischen Analyse von Proben
by
HUNG
,
YAU Y
., ROCHESTER, MICH., US
Year of Publication
16.12.1993
Get full text
Patent
Save to List
Saved in:
16
Loading…
Method and apparatus for interferometric deformation analysis
by
GRANT; RALPH M
,
HUNG
;
YAU Y
Year of Publication
13.02.1979
Get full text
Patent
Save to List
Saved in:
17
Loading…
Improved structure for business card box
by
HUNG
,
YAU
-
Y
U
Year of Publication
01.10.2002
Get full text
Patent
Save to List
Saved in:
18
Loading…
Method for manufacturing a light guide plate mold and the mold thereof
by
Y
E,
HUNG
-
YAU
,
CHEN, WEI-HSIUN
Year of Publication
11.09.2007
Get full text
Patent
Save to List
Saved in:
RSS Feed
Email Search
Save Search
Search History
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit to articles from scholarly journals
Limit to articles with full text available
Limit to Open Access content
Exclude newspaper articles
Include articles at other libraries
Expand results using synonyms
Format
Patent
16 results
16
Journal Article
2 results
2
Subject Area
physics
16 results
16
chemistry
15 results
15
medicine
15 results
15
sciences
15 results
15
Topic
physics
15 results
15
measuring
13 results
13
measuring angles
13 results
13
measuring areas
13 results
13
measuring irregularities of surfaces or contours
13 results
13
measuring length, thickness or similar lineardimensions
13 results
13
See more
Language
English
17 results
17
French
3 results
3
German
3 results
3
Year of Publication
From:
To:
Database
esp@cenet
15 results
15
ScienceDirect Freedom Collection 2013
1 results
1
Elsevier Complete Freedom Collection
1 results
1
Elsevier ScienceDirect Freedom Collection
1 results
1
Elsevier Journals
1 results
1
USPTO Issued Patents
1 results
1
See more