Material Characterization of Test Contact Pin
Ramamoorthy, Praveen kumar, Fischer, Florian, Guan, Han, Hudda, Murad
Published in MATEC Web of Conferences (01.01.2018)
Published in MATEC Web of Conferences (01.01.2018)
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Journal Article
Conference Proceeding
Test pin configuration for test device for testing devices under test
Sugianto, Yusman, Swee Lee, Gan, Chyeo Yong, Tay, Tan, Wee Kuan, Hudda, Murad, Hiew, Fu San, Yussuff, Arieff Ridzwan, Tan, Siao Kiat, Xiaojun, Wang, Dandong, Ge, Chow York, Lee
Year of Publication 05.02.2019
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Year of Publication 05.02.2019
Patent
Test Pin Configuration for Test Device for Testing Devices Under Test
TAN Wee Kuan, HIEW Fu San, TAN Siao Kiat, YUSSUFF Arieff Ridzwan, CHYEO YONG Tay, SUGIANTO Yusman, CHOW YORK Lee, SWEE LEE Gan, DANDONG Ge, HUDDA Murad, XIAOJUN Wang
Year of Publication 22.06.2017
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Year of Publication 22.06.2017
Patent
Prüfstiftkonfiguration für eine Prüfvorrichtung zum Prüfen von Prüflingen
Sugianto, Yusman, Gan, Swee Lee, Hudda, Murad, Tan, Wee Kuan, Hiew, Fu San, Yussuff, Arieff Ridzwan, Lee, Chow York, Tan, Siao Kiat, Ge, Dandong, Wang, Xiaojun, Tay, Chyeo Yong
Year of Publication 22.06.2017
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Year of Publication 22.06.2017
Patent