Talent Identification in Elite Adolescent Ice Hockey Players: The Discriminant Capacity of Fitness Tests, Skating Performance and Psychological Characteristics
Lemoyne, Jean, Brunelle, Jean-François, Huard Pelletier, Vincent, Glaude-Roy, Julien, Martini, Gaëtan
Published in Sports (Basel) (08.04.2022)
Published in Sports (Basel) (08.04.2022)
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Journal Article
A Complete Characterization and Modeling of the BTI-Induced Dynamic Variability of SRAM Arrays in 28-nm FD-SOI Technology
El Husseini, Joanna, Garros, Xavier, Cluzel, Jacques, Subirats, Alexandre, Makosiej, Adam, Weber, Olivier, Thomas, Olivier, Huard, Vincent, Federspiel, Xavier, Reimbold, Gilles
Published in IEEE transactions on electron devices (01.12.2014)
Published in IEEE transactions on electron devices (01.12.2014)
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Journal Article
Embracing the new era of AI at the edge
Huard, Vincent
Published in 2023 International Conference on IC Design and Technology (ICICDT) (25.09.2023)
Published in 2023 International Conference on IC Design and Technology (ICICDT) (25.09.2023)
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Conference Proceeding
Two independent components modeling for Negative Bias Temperature Instability
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Conference Proceeding
Testing the predictive validity of combine tests among junior elite football players: an 8-yr follow-up
Yao, Pierre-Luc, Pelletier, Vincent Huard, Lemoyne, Jean
Published in The sport journal (08.12.2020)
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Published in The sport journal (08.12.2020)
Journal Article
Correlation Technologies for Emerging Wireless Applications
Wane, Sidina, Ferrero, Fabien, Dinh, Thanh Vinh, Bajon, Damienne, Duvillaret, Lionel, Gaborit, Gwenaël, Huard, Vincent
Published in Electronics (Basel) (01.04.2022)
Published in Electronics (Basel) (01.04.2022)
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Journal Article
Performance vs. reliability adaptive body bias scheme in 28nm & 14nm UTBB FDSOI nodes
Ndiaye, C., Huard, V., Federspiel, X., Cacho, F., Bravaix, A.
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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Journal Article
NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI
Sivadasan, Ajith, Shah, Riddhi Jitendrakumar, Huard, Vincent, Cacho, Florian, Anghel, Lorena
Published in 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2018)
Published in 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2018)
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Conference Proceeding
22.1 A 12.4TOPS/W @ 136GOPS AI-IoT System-on-Chip with 16 RISC-V, 2-to-8b Precision-Scalable DNN Acceleration and 30%-Boost Adaptive Body Biasing
Conti, Francesco, Rossi, Davide, Paulin, Gianna, Garofalo, Anaelo, Di Mauro, Alfio, Rutishauer, Georg, Ottavi, Gian marco, Eggimann, Manuel, Okuhara, Hayate, Huard, Vincent, Montfort, Olivier, Jure, Lionel, Exibard, Nils, Gouedo, Pascal, Louvat, Mathieu, Botte, Emmanuel, Benini, Luca
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
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Conference Proceeding
35.2 A 0.021mm2 PVT-Aware Digital-Flow-Compatible Adaptive Back-Biasing Regulator with Scalable Drivers Achieving 450% Frequency Boosting and 30% Power Reduction in 22nm FDSOI Technology
Moursy, Yasser, Da Rosa, Thiago Raupp, Jure, Lionel, Quelen, Anthony, Genevey, Sebastien, Pierrefeu, Lionel, Grand, Emmanuel, Winkler, Joerg, Park, Jonathan, Pillonnet, Gael, Huard, Vincent, Bonzo, Andrea, Flatresse, Philippe
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding
Design-in-Reliable Millimeter-Wave Power Amplifiers in a 65-nm CMOS Process
Quemerais, Thomas, Moquillon, L., Fournier, J., Benech, P., Huard, V.
Published in IEEE transactions on microwave theory and techniques (01.04.2012)
Published in IEEE transactions on microwave theory and techniques (01.04.2012)
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Journal Article
Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature
Bravaix, A., Guerin, C., Huard, V., Roy, D., Roux, J.M., Vincent, E.
Published in 2009 IEEE International Reliability Physics Symposium (01.01.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.01.2009)
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Conference Proceeding