by Huard, V., Denais, M., Parthasarathy, C.
Published in Microelectronics and reliability (2006)

by Planes, N., Weber, O., Barral, V., Haendler, S., Noblet, D., Croain, D., Bocat, M., Sassoulas, P., Federspiel, X., Cros, A., Bajolet, A., Richard, E., Dumont, B., Perreau, P., Petit, D., Golanski, D., Fenouillet-Beranger, C., Guillot, N., Rafik, M., Huard, V., Puget, S., Montagner, X., Jaud, M., Rozeau, O., Saxod, O., Wacquant, F., Monsieur, F., Barge, D., Pinzelli, L., Mellier, M., Boeuf, F., Arnaud, F., Haond, M.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)

by Mamy Randriamihaja, Yoann, Huard, V., Federspiel, X., Zaka, A., Palestri, P., Rideau, D., Roy, D., Bravaix, A.
Published in Microelectronics and reliability (01.11.2012)

by Huard, V, V, Cox, RT, Saminadayar, K, Arnoult, A, Tatarenko, S
Published in Physical review letters (03.01.2000)

by Huard, V., Ruiz, N., Cacho, F., Pion, E.
Published in Microelectronics and reliability (01.09.2011)

by Bravaix, A., Guerin, C., Huard, V., Roy, D., Roux, J.M., Vincent, E.
Published in 2009 IEEE International Reliability Physics Symposium (01.01.2009)

by Abbati, L. Degli, Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P.
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)

by Lachance, A., Ben-shoshan, M., Cournoyer, A., Daoust, R., La Vieille, S., Huard, V., Lessard, J., Paquet, J., Marquis, M., Gabrielli, S., Shand, G., Morris, J.
Published in Canadian journal of emergency medicine (01.05.2019)

by Huard, V., Denais, M.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Huard, V., Denais, M., Perrier, F., Revil, N., Parthasarathy, C., Bravaix, A., Vincent, E.
Published in Microelectronics and reliability (2005)

by Benhassain, A., Cacho, F., Huard, V., Saliva, M., Anghel, L., Parthasarathy, C., Jain, A., Giner, F.
Published in 2015 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2015)

by Anghel, Lorena, Benhassain, A., Sivadasan, A., Cacho, F., Huard, V.
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)

by Huard, V., Cacho, F., Mamy Randriamihaja, Y., Bravaix, A.
Published in Microelectronic engineering (01.07.2011)

by Randriamihaja, Y. Mamy, Federspiel, X., Huard, V., Bravaix, A., Palestri, P.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Guerin, C., Huard, V., Bravaix, A.
Published in Microelectronic engineering (01.09.2007)

by Huard, V
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)

by Parthasarathy, C.R., Denais, M., Huard, V., Ribes, G., Roy, D., Guerin, C., Perrier, F., Vincent, E., Bravaix, A.
Published in Microelectronics and reliability (01.09.2006)

by Randriamihaja, Y M, Bravaix, A, Huard, V, Rideau, D, Rafik, M, Roy, D
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)

by Cacho, F, Ighilahriz, S, Diop, M, Roy, D, Huard, V
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)

by Bravaix, A, Guérin, C, Goguenheim, D, Huard, V, Roy, D, Besset, C, Renard, S, Randriamihaja, Y M, Vincent, E
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)