Extracting F-N stress-induced interface states in SOI NMOSFETs by forward gated-diode
Jin He, Xing Zhang, Aihua Huang, Ru Huang, Yangyuan Wang
Published in 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) (2001)
Published in 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) (2001)
Get full text
Conference Proceeding