Field of view alignment with multiple RGB-D cameras
Wei-Chung Hu, Chang-Hong Lin
Published in 2013 IEEE International Symposium on Consumer Electronics (ISCE) (01.06.2013)
Published in 2013 IEEE International Symposium on Consumer Electronics (ISCE) (01.06.2013)
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Conference Proceeding
Reactive Programming Collaborative Agents for Self-Managing Software Teams
Wei-Chung Hu, Tzu-Tan Wei, Cheng-Feng Yang, Jiau, Hewijin Christine
Published in 2016 International Computer Symposium (ICS) (01.12.2016)
Published in 2016 International Computer Symposium (ICS) (01.12.2016)
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Conference Proceeding
A FAQ Finding Process in Open Source Project Forums
Wei-Chung Hu, Dung-Feng Yu, Jiau, Hewijin Christine
Published in 2010 Fifth International Conference on Software Engineering Advances (01.08.2010)
Published in 2010 Fifth International Conference on Software Engineering Advances (01.08.2010)
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Conference Proceeding
Mask defect prevention
Hu, Wei-Chung, Lin, Cheng-Ming, Tu, Chih-Chiang, Chen, Ching-Yueh, Hsu, Ting-Chang, Chen, Yu-Tung, Lu, Chi-Ta
Year of Publication 02.01.2024
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Year of Publication 02.01.2024
Patent
Mask Defect Prevention
Hu, Wei-Chung, Lin, Cheng-Ming, Tu, Chih-Chiang, Chen, Ching-Yueh, Hsu, Ting-Chang, Chen, Yu-Tung, Lu, Chi-Ta
Year of Publication 16.11.2023
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Year of Publication 16.11.2023
Patent
Semiconductor wafer measurement method and system
Chang, Yung-Jung, Hu, Wei-Chung, Chen, Peng-Ren, Wang, Shiang-Bau, Huang, Yi-An, Cheng, Wen-Hao, Chen, Jyun-Hong
Year of Publication 06.06.2023
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Year of Publication 06.06.2023
Patent
Mask Defect Prevention
Hu, Wei-Chung, Lin, Cheng-Ming, Tu, Chih-Chiang, Chen, Ching-Yueh, Hsu, Ting-Chang, Chen, Yu-Tung, Lu, Chi-Ta
Year of Publication 03.11.2022
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Year of Publication 03.11.2022
Patent
Mask defect prevention
Hu, Wei-Chung, Lin, Cheng-Ming, Tu, Chih-Chiang, Chen, Ching-Yueh, Hsu, Ting-Chang, Chen, Yu-Tung, Lu, Chi-Ta
Year of Publication 02.08.2022
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Year of Publication 02.08.2022
Patent
Mask Defect Prevention
Hu, Wei-Chung, Lin, Cheng-Ming, Tu, Chih-Chiang, Chen, Ching-Yueh, Hsu, Ting-Chang, Chen, Yu-Tung, Lu, Chi-Ta
Year of Publication 03.03.2022
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Year of Publication 03.03.2022
Patent
Semiconductor wafer measurement method and system
Chang, Yung-Jung, Hu, Wei-Chung, Chen, Peng-Ren, Wang, Shiang-Bau, Huang, Yi-An, Cheng, Wen-Hao, Chen, Jyun-Hong
Year of Publication 17.08.2021
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Year of Publication 17.08.2021
Patent
Semiconductor wafer measurement method and system
Chang, Yung-Jung, Hu, Wei-Chung, Chen, Peng-Ren, Wang, Shiang-Bau, Huang, Yi-An, Cheng, Wen-Hao, Chen, Jyun-Hong
Year of Publication 01.09.2020
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Year of Publication 01.09.2020
Patent
Method and system for diagnosing a semiconductor wafer
Chang, Yung-Jung, Hu, Wei-Chung, Chen, Peng-Ren, Wang, Shiang-Bau, Huang, Yi-An, Cheng, Wen-Hao, Chen, Jyun-Hong
Year of Publication 28.05.2019
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Year of Publication 28.05.2019
Patent
Verfahren und Systeme zum Diagnostizieren eines Halbleiter-Wafers
Hu, Wei-Chung, Chen, Peng-Ren, Chang, Yung Jung, Wang, Shiang-Bau, Huang, Yi-An, Cheng, Wen-Hao, Chen, Jyun-Hong
Year of Publication 27.01.2022
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Year of Publication 27.01.2022
Patent
Verfahren und Systeme zum Diagnostizieren eines Halbleiter-Wafers
Hu, Wei-Chung, Chen, Peng-Ren, Chang, Yung Jung, Wang, Shiang-Bau, Huang, Yi-An, Cheng, Wen-Hao, Chen, Jyun-Hong
Year of Publication 23.03.2017
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Year of Publication 23.03.2017
Patent
SEMICONDUCTOR WAFER MEASUREMENT METHOD AND SYSTEM
CHEN, Peng-Ren, CHEN, Jyun-Hong, CHANG, Yung-Jung, WANG, Shiang-Bau, HUANG, Yi-An, HU, Wei-Chung, CHENG, Wen-Hao
Year of Publication 04.11.2021
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Year of Publication 04.11.2021
Patent
SEMICONDUCTOR WAFER MEASUREMENT METHOD AND SYSTEM
CHEN, Peng-Ren, CHANG, Yung-Jung, CHEN, Jyun-Hong, WANG, Shiang-Bau, HUANG, Yi-An, HU, Wei-Chung, CHENG, Wen-Hao
Year of Publication 19.11.2020
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Year of Publication 19.11.2020
Patent