by Sung, Po-Jung, Chang, Shu-Wei, Kao, Kuo-Hsing, Wu, Chien-Ting, Su, Chun-Jung, Cho, Ta-Chun, Hsueh, Fu-Kuo, Lee, Wen-Hsi, Lee, Yao-Jen, Chao, Tien-Sheng
Published in IEEE transactions on electron devices (01.09.2020)

by Chen, Bo-Yuan, Chen, Kun-Ming, Chiu, Chia-Sung, Huang, Guo-Wei, Chen, Hsiu-Chih, Chen, Chun-Chi, Hsueh, Fu-Kuo, Chang, Edward Yi
Published in IEEE transactions on electron devices (01.10.2018)

by Lee, Yao-Jen, Cho, Ta-Chun, Chuang, Shang-Shiun, Hsueh, Fu-Kuo, Lu, Yu-Lun, Sung, Po-Jung, Chen, Hsiu-Chih, Current, Michael I., Tseng, Tseung-Yuen, Chao, Tien-Sheng, Hu, Chenming, Yang, Fu-Liang
Published in IEEE transactions on electron devices (01.03.2014)

by Sung, Po-Jung, Cho, Ta-Chun, Hou, Fu-Ju, Hsueh, Fu-Kuo, Chung, Sheng-Ti, Lee, Yao-Jen, Current, Michael I., Chao, Tien-Sheng
Published in IEEE transactions on electron devices (01.05.2017)

by Chen, Wei-Hao, Chen, Chien-Fu, Chen, Yi-Ju, Chiu, Hsiao-Yun, Shen, Chang-Hong, Shieh, Jia-Min, Hsueh, Fu-Kuo, Yang, Chih-Chao, Chen, Bo-Yuan, Huang, Guo-Wei, Li, Kai-Shin, Yeh, Wen-Kuan, Yamauchi, Hiroyuki, Chang, Meng-Fan
Published in IEEE electron device letters (01.08.2018)

by Fu-Ju Hou, Po-Jung Sung, Fu-Kuo Hsueh, Chien-Ting Wu, Yao-Jen Lee, Yiming Li, Samukawa, Seiji, Tuo-Hung Hou
Published in IEEE transactions on electron devices (01.10.2016)

by Hou, Fu-Ju, Sung, Po-Jung, Hsueh, Fu-Kuo, Wu, Chien-Ting, Lee, Yao-Jen, Chang, Mao-Nang, Li, Yiming, Hou, Tuo-Hung
Published in IEEE transactions on electron devices (01.05.2016)

by Sung, Po-Jung, Su, Chun-Jung, Lo, Shih-Hsuan, Hsueh, Fu-Kuo, Lu, Darsen D., Lee, Yao-Jen, Chao, Tien-Sheng
Published in IEEE journal of the Electron Devices Society (2020)

by Yao-Jen Lee, Bo-An Tsai, Chiung-Hui Lai, Zheng-Yao Chen, Fu-Kuo Hsueh, Po-Jung Sung, Current, Michael I., Chih-Wei Luo
Published in IEEE electron device letters (01.10.2013)

by Ramanathan, Akshay Krishna, Rangachar, Srivatsa Srinivasa, Govindarajan, Hariram Thirucherai, Hung, Je-Min, Lee, Chun-Ying, Xue, Cheng-Xin, Huang, Sheng-Po, Hsueh, Fu-Kuo, Shen, Chang-Hong, Shieh, Jia-Min, Yeh, Wen-Kuan, Ho, Mon-Shu, Sampson, Jack, Chang, Meng-Fan, Narayanan, Vijaykrishnan
Published in IEEE journal on exploratory solid-state computational devices and circuits (01.06.2021)

by LEE, Yao-Jen, CHUANG, Shang-Shiun, HSUEH, Fu-Kuo, LIN, Ho-Ming, WU, Shich-Chuang, WU, Ching-Yi, TSENG, Tseung-Yuen
Published in IEEE electron device letters (01.02.2011)

by Fu-Kuo Hsueh, Yao-Jen Lee, Kun-Lin Lin, Current, M I, Ching-Yi Wu, Tien-Sheng Chao
Published in IEEE transactions on electron devices (01.07.2011)

by Yu-Lun Lu, Fu-Kuo Hsueh, Kuo-Ching Huang, Tz-Yen Cheng, Kowalski, Jeff M, Kowalski, Jeff E, Yao-Jen Lee, Tien-Sheng Chao, Ching-Yi Wu
Published in IEEE electron device letters (01.05.2010)

by CHEN, Hou-Yu, CHEN, Chun-Chi, HSUEH, Fu-Kuo, LIU, Jan-Tsai, SHY, Shyi-Long, WU, Cheng-San, CHIEN, Chao-Hsin, CHENMING HU, HUANG, Chien-Chao, YANG, Fu-Liang
Published in IEEE transactions on electron devices (01.11.2011)

by Yao-Jen Lee, Fu-Kuo Hsueh, Shih-Chiang Huang, Kowalski, J.M., Kowalski, J.E., Cheng, A., Ann Koo, Guang-Li Luo, Ching-Yi Wu
Published in IEEE electron device letters (01.02.2009)

by Lee, Yao-Jen, Hsueh, Fu-Kuo, Current, Michael I., Wu, Ching-Yi, Chao, Tien-Sheng
Published in IEEE electron device letters (01.06.2023)

by Lee, Yao-Jen, Cho, Ta-Chun, Chuang, Shang-Shiun, Hsueh, Fu-Kuo, Lu, Yu-Lun, Sung, Po-Jung, Chen, Hsiu-Chih, Current, Michael I., Tseng, Tseung-Yuen, Chao, Tien-Sheng, Hu, Chenming, Yang, Fu-Liang
Published in IEEE transactions on electron devices (01.07.2023)

by Chen, Bo-Yuan, Chen, Kun-Ming, Shiao, Yu-Shao Jerry, Lin, Chuang-Ju, Huang, Guo-Wei, Chen, Hsiu-Chih, Hsueh, Fu-Kuo, Shen, Chang-Hong, Shieh, Jia-Min, Chang, Edward Yi
Published in Japanese Journal of Applied Physics (01.04.2019)

by Li, Kai-Shin, Wei, Yun-Jie, Chen, Yi-Ju, Chiu, Wen-Cheng, Chen, Hsiu-Chih, Lee, Min-Hung, Chiu, Yu-Fan, Hsueh, Fu-Kuo, Wu, Bo-Wei, Chen, Pin-Guang, Lai, Tung-Yan, Chen, Chun-Chi, Shieh, Jia-Min, Yeh, Wen-Kuan, Salahuddin, Sayeef, Hu, Chenming
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)

by Chen, Bo-Yuan, Chen, Kun-Ming, Chiu, Chia-Sung, Huang, Guo-Wei, Chen, Hsiu-Chih, Chen, Chun-Chi, Hsueh, Fu-Kuo, Chen, Min-Cheng, Chang, Edward Yi
Published in Japanese Journal of Applied Physics (01.04.2017)