Scan Compression Implementation in Industrial Design - Case Study
Get full text
Conference Proceeding
The test cost reduction benefits of combining a hierarchical DFT methodology with EDT channel sharing - A case study
Lu, Binghua, Sha, Selina, Wang, Jincheng, Zhang, Zhigao, Meng, Fanjin, Hsu, Dragon, Fisette, Rick
Published in 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) (01.04.2018)
Published in 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) (01.04.2018)
Get full text
Conference Proceeding