Closed loop structure to prevent couplings on CMOS process
Hsiao-Tsung Yen, Chih-Wei Lai, Chih-Yu Tsai, Cheng-wei Luo, Yuh-Sheng Jean, Ta-Hsun Yeh, Po-Chih Wang, Ka-un Chan, Ying-Hsi Lin
Published in 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) (01.07.2016)
Published in 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) (01.07.2016)
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Conference Proceeding
TSV RF de-embedding method and modeling for 3DIC
Hsiao-Tsung Yen, Yu-ling Lin, Hu, C., Jan, S. B., Chi-Chun Hsieh, Chen, M. F., Chin-Wei Kuo, Ho-Hsiang Chen, Min-Chie Jeng
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
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Conference Proceeding
An extended de-embedding method for on-wafer components
Yu-Ling Lin, Hsiao-Tsung Yen, Ho-Hsiang Chen, Chewn-Pu Jou, Chin-Wei Kuo, Min-Che Jeng, Fu-Lung Hsuch, Chih-Hua Hsiao, Guo-Wei Huang
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
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Conference Proceeding