NVM Tunnel Oxide Integration in an Advanced BCD Node and its Impact on GOI
Liu, Gang, Lipinski, Matthias, Hose, Sallie, Menon, Santosh
Published in 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (13.05.2024)
Published in 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (13.05.2024)
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Conference Proceeding
Plasma Enhanced Atomic Layer Deposition of Al2O3/SiO2 MIM Capacitors
Austin, Dustin Z., Allman, Derryl, Price, David, Hose, Sallie, Conley, John F.
Published in IEEE electron device letters (01.05.2015)
Published in IEEE electron device letters (01.05.2015)
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Journal Article
Correction to Atomic Layer Deposition of Ruthenium and Ruthenium Oxide Using a Zero Oxidation State Precursor
Austin, Dustin Z, Jenkins, Melanie A, Allman, Derryl, Hose, Sallie, Price, David, Dezelah, Charles L, Conley, John F
Published in Chemistry of materials (26.12.2018)
Published in Chemistry of materials (26.12.2018)
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Journal Article
Physical and Electrical Characterization of Deep Trench Isolation in Bulk Silicon and SOI Substrates
Agam, Moshe, Jerome, Rick, Boukhanfra, Lahcen, Eda, Masaichi, Su, Lan, Hose, Sallie, Bates, Kenn, Janssens, Johan, Pjencak, Jaroslav, Chen, Weize, Long, Thomas
Published in 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (10.05.2021)
Published in 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (10.05.2021)
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Conference Proceeding
Stability study of native epitaxial transistors as process probe for contamination detection
Agam, Moshe, Suwhanov, Agajan, Lee, Ashley, Henninger, Josh, Hose, Sallie
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
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Conference Proceeding
New modular high voltage LDMOS technology based on Deep Trench Isolation and 0.18um CMOS platform
Agam, Moshe, Yao, Thierry, Suwhanov, Agajan, Myers, Tracy, Ota, Yutaka, Hose, Sallie, Comard, Matt
Published in 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) (01.05.2014)
Published in 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) (01.05.2014)
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Conference Proceeding
Reliability of Power Devices with Copper Wire Bond
Pinili, Ton, Ramos, Manny, Manalo, Ginbert, Brizar, Guy, Matthijs, Koen, Colle, Frederik, DeGreve, Johan, Kocourek, Petr, Cowell, Bill, Jensen, John, McGlone, John, Hose, Sallie, Gambino, Jeff
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
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Conference Proceeding
METAL INSULATOR METAL (MIM) CAPACITORS
HOSE, Sallie J, GAMBINO, Jeffrey Peter, PIATT, Gregory Frank, ALLMAN, Derryl, PRICE, David T, HASEGAWA, Akihiro, BATES, Kenneth Andrew
Year of Publication 15.10.2020
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Year of Publication 15.10.2020
Patent
METAL INSULATOR METAL (MIM) CAPACITORS
GAMBINO JEFFREY PETER, BATES KENNETH ANDREW, PRICE DAVID T, ALLMAN DERRYL, HOSE SALLIE J, PIATT GREGORY FRANK, HASEGAWA AKIHIRO
Year of Publication 20.10.2020
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Year of Publication 20.10.2020
Patent
METALL-ISOLATOR-METALL-KONDENSATOREN (MIM-KONDENSATOREN)
Hasegawa, Akihiro, Piatt, Gregory Frank, Hose, Sallie J, Price, David T, Gambino, Jeffrey Peter, Bates, Kenneth Andrew, Allman, Derryl
Year of Publication 15.10.2020
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Year of Publication 15.10.2020
Patent