Search Results - "HOOGENBOOM, Jacob Pieter" :: K.UTB vyhledávací portál

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Integrated optical and charged particle inspection apparatus

by Den Hoedt, Sander, Hoogenboom, Jacob Pieter
Year of Publication 29.08.2023

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METHOD AND APPARATUS FOR DETERMINING A DENSITY OF FLUORESCENT MARKERS IN A SAMPLE

by KRUIT, Pieter, HOOGENBOOM, Jacob Pieter
Year of Publication 17.11.2021

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METHOD FOR INSPECTING A SAMPLE USING AN ASSEMBLY COMPRISING A SCANNING ELECTRON MICROSCOPE AND A LIGHT MICROSCOPE

by LIV HAMARAT, Nalan, KRUIT, Pieter, HOOGENBOOM, Jacob Pieter
Year of Publication 21.08.2024

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METHOD FOR INSPECTING A SAMPLE USING AN ASSEMBLY COMPRISING A SCANNING ELECTRON MICROSCOPE AND A LIGHT MICROSCOPE

by LIV HAMARAT, Nalan, KRUIT, Pieter, HOOGENBOOM, Jacob Pieter
Year of Publication 21.08.2024

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INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

by DEN HOEDT, Sander, HOOGENBOOM, Jacob Pieter
Year of Publication 02.06.2022

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INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

by DEN HOEDT, Sander, HOOGENBOOM, Jacob Pieter
Year of Publication 26.01.2022

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Apparatus and method for manipulating thin film sections or ribbons of thin film sections

by NAHUM PANG, JACOB PIETER HOOGENBOOM, ELIZABETH CATHERINE MARIE CARROLL
Year of Publication 20.09.2022

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Integrated optical and charged particle inspection apparatus

by JACOB PIETER HOOGENBOOM, SANDER DEN HOEDT
Year of Publication 25.09.2020

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INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

by DEN HOEDT, Sander, HOOGENBOOM, Jacob Pieter
Year of Publication 24.09.2020

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Method for localizing a region of interest in a sample and micromachining the sample using a charged particle beam

by DAAN BENJAMIN BOLTJE, ERNEST BENJAMIN VAN DER WEE, JACOB PIETER HOOGENBOOM
Year of Publication 06.02.2024

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Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling

by RADIM SKOUPÝ, DAAN BENJAMIN BOLTJE, JACOB PIETER HOOGENBOOM, ARJEN-JOACHIM JAKOBI
Year of Publication 06.02.2024

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METHOD FOR LOCALIZING A REGION OF INTEREST IN A SAMPLE AND MICROMACHINING THE SAMPLE USING A CHARGED PARTICLE BEAM

by VAN DER WEE, Ernest Benjamin, BOLTJE, Daan Benjamin, HOOGENBOOM, Jacob Pieter
Year of Publication 01.02.2024

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METHOD AND APPARATUS FOR IN-SITU SAMPLE QUALITY INSPECTION IN CRYOGENIC FOCUSED ION BEAM MILLING

by SKOUPÝ, Radim, JAKOBI, Arjen-Joachim, BOLTJE, Daan Benjamin, HOOGENBOOM, Jacob Pieter
Year of Publication 01.02.2024

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Method and apparatus for determining a density of fluorescent markers in a sample

by Hoogenboom, Jacob Pieter, Kruit, Pieter
Year of Publication 20.11.2018

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INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

by KRUIT, Pieter, NARVÁEZ-GONZÁLEZ, Angela Carolina, ZONNEVYLLE, Aernout Christiaan, HOOGENBOOM, Jacob Pieter
Year of Publication 28.06.2023

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INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

by KRUIT, Pieter, NARVÁEZ-GONZÁLEZ, Angela Carolina, ZONNEVYLLE, Aernout Christiaan, HOOGENBOOM, Jacob Pieter
Year of Publication 28.06.2023

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INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS

by KRUIT, Pieter, ZONNEVYLLE, Aernout Christian, LIV, Nalan, HOOGENBOOM, Jacob Pieter
Year of Publication 09.06.2021

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METHOD FOR RECORDING AND CORRELATING LIGHT AND CHARGED PARTICLE MICROSCOPY IMAGES

by DEN HOEDT, Sander, SRINIVASA RAJA, Aditi, LANE, Ryan Irwin, HOOGENBOOM, Jacob Pieter
Year of Publication 14.12.2022

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METHOD FOR POSITIONING A FOCAL PLANE OF A LIGHT IMAGING DEVICE AND APPARATUS ARRANGED FOR APPLYING SAID METHOD

by LIV HAMARAT, Nalan, KRUIT, Pieter, NARVAEZ, Angela Carolina, HOOGENBOOM, Jacob Pieter
Year of Publication 22.06.2022

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METHOD AND APPARATUS FOR DETERMINING A DENSITY OF FLUORESCENT MARKERS IN A SAMPLE

by HOOGENBOOM Jacob Pieter, KRUIT Pieter
Year of Publication 29.12.2016

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