Extracting Mobility Degradation and Total Series Resistance of Cylindrical Gate-All-Around Silicon Nanowire Field-Effect Transistors
Choi, Luryi, Hong, Byoung Hak, Jung, Young Chai, Cho, Keun Hwi, Yeo, Kyoung Hwan, Kim, Dong-Won, Jin, Gyo Young, Oh, Kyung Seok, Lee, Won-Seong, Song, Sang-Hun, Rieh, Jae Sung, Whang, Dong Mok, Hwang, Sung Woo
Published in IEEE electron device letters (01.06.2009)
Published in IEEE electron device letters (01.06.2009)
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Journal Article
Co-existence of Random Telegraph Noise and Single-Hole-Tunneling State in Gate-All-Around PMOS Silicon Nanowire Field-Effect-Transistors
Hong, Byoung-Hak, Lee, Seong-Joo, Hwang, Sung-Woo, Cho, Keun-Hwi, Yeo, Kyoung-Hwan, Kim, Dong-Won, Jin, Gyo-Young, Park, Dong-Gun
Published in Journal of semiconductor technology and science (2011)
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Published in Journal of semiconductor technology and science (2011)
Journal Article