Growth of III–V semiconductor layers on Si patterned substrates
Gorbach, T.Ya, Holiney, R.Yu, Matveeva, L.A, Smertenko, P.S, Svechnikov, S.V, Venger, E.F, Ciach, R, Faryna, M
Published in Thin solid films (30.12.1998)
Published in Thin solid films (30.12.1998)
Get full text
Journal Article
Conference Proceeding
Electroreflectance study of macroporous silicon surfaces
Holiney, R.Yu, Matveeva, L.A, Venger, E.F, Livinenko, A.O, Karachevtseva, L.A
Published in Applied surface science (15.03.2001)
Published in Applied surface science (15.03.2001)
Get full text
Journal Article
Effect of the Si wafer pretreatment on the patterned substrate morphology and growth of Hg1-xCdxTe PLD films
GORBACH, T. Ya, HOLINEY, R. Yu, MATVEEVA, L. A, SVECHNIKOV, S. V, VENGER, E. F, KUZMA, M, WISZ, G
Published in Materials science & engineering. B, Solid-state materials for advanced technology (14.02.2000)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (14.02.2000)
Get full text
Conference Proceeding
Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments
Gorbach, T.Ya, Holiney, R.Yu, Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.12.1998)
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.12.1998)
Get full text
Journal Article