Inline imaging-ellipsometer for printed electronics
Huemer, Florian, Jamalieh, Murad, Bammer, Ferdinand, Hönig, Dirk
Published in Technisches Messen (28.10.2016)
Published in Technisches Messen (28.10.2016)
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Journal Article
Imaging of the domain organization in sphingomyelin and phosphatidylcholine monolayers
Prenner, Elmar, Honsek, Gerlinde, Hönig, Dirk, Möbius, Dietmar, Lohner, Karl
Published in Chemistry and physics of lipids (01.02.2007)
Published in Chemistry and physics of lipids (01.02.2007)
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Journal Article
Laser-induced phase change in Langmuir films observed using nanosecond pump-probe Brewster angle microscopy
Hobley, Jonathan, Oori, Tomoya, Kajimoto, Shinji, Gorelik, Sergey, Hönig, Dirk, Hatanaka, Koji, Fukumura, Hiroshi
Published in Applied physics. A, Materials science & processing (01.12.2008)
Published in Applied physics. A, Materials science & processing (01.12.2008)
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Journal Article
Time-resolved brewster angle microscopy for photochemical and photothermal studies on thin-films and monolayers
Hobley, Jonathan, Oori, Tomoya, Gorelik, Sergey, Kajimoto, Shinji, Fukumura, Hiroshi, Hönig, Dirk
Published in Journal of nanoscience and nanotechnology (01.01.2009)
Published in Journal of nanoscience and nanotechnology (01.01.2009)
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Journal Article
Fabry‐Perot‐based Layer Stacks for Ellipsometric Encoding: Embedded Public, Hidden, and Forensic Information for Product Authentication
Beck, Uwe, Hönig, Dirk, Schneider, Stefan, Domnick, Ralph, Belzner, Mathias, Hertwig, Andreas, Stephanowitz, Ralph, Sahre, Mario, Weise, Matthias
Published in Vakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten (01.08.2012)
Published in Vakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten (01.08.2012)
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