Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs
Sasaki, Hajime, Hisaka, Takayuki, Kadoiwa, Kaoru, Oku, Tomoki, Onoda, Shinobu, Ohshima, Takeshi, Taguchi, Eiji, Yasuda, Hidehiro
Published in Microelectronics and reliability (01.02.2018)
Published in Microelectronics and reliability (01.02.2018)
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Journal Article
Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions
Hisaka, Takayuki, Sasaki, Hajime, Nogami, Yoichi, Hosogi, Kenji, Yoshida, Naohito, Villanueva, A.A., del Alamo, Jesus A., Hasegawa, Shigehiko, Asahi, Hajime
Published in Microelectronics and reliability (01.12.2009)
Published in Microelectronics and reliability (01.12.2009)
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Journal Article
Degradation Mechanism of AlGaAs/InGaAs Power Pseudomorphic High-Electron-Mobility Transistors under Large-Signal Operation
Hisaka, Takayuki, Nogami, Yoichi, Sasaki, Hajime, Yoshida, Naohito, Hayashi, Kazuo, Villanueva, Anita A., Alamo, Jesus A. del
Published in Japanese Journal of Applied Physics (01.02.2008)
Published in Japanese Journal of Applied Physics (01.02.2008)
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