A wafer level monitoring method for plasma-charging damage using antenna PMOSFET test structure
Watanabe, H., Komori, J., Higashitani, K., Sekine, M., Koyama, H.
Published in IEEE transactions on semiconductor manufacturing (01.05.1997)
Published in IEEE transactions on semiconductor manufacturing (01.05.1997)
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A 2 V 250 MHz multimedia processor
Yoshida, T., Shimazu, Y., Yamada, A., Holmann, E., Nakakimura, K., Takata, H., Kitao, M., Kishi, T., Kobayashi, H., Sato, M., Mohri, A., Suzuki, K., Ajioka, Y., Higashitani, K.
Published in 1997 IEEE International Solids-State Circuits Conference. Digest of Technical Papers (01.01.1997)
Published in 1997 IEEE International Solids-State Circuits Conference. Digest of Technical Papers (01.01.1997)
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