A practical approach to static signal electromigration analysis
NS, Nagaraj, Cano, Frank, Haznedar, Haldun, Young, Duane
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 35th annual conference on Design automation; 15-19 June 1998 (1998)
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 35th annual conference on Design automation; 15-19 June 1998 (1998)
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Conference Proceeding
A methodology for chip-level electromigration risk assessment and product qualification
Chanhee Oh, Haznedar, H., Gall, M., Grinshpon, A., Zolotov, V., Pon Ku, Panda, R.
Published in International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720) (2004)
Published in International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720) (2004)
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Conference Proceeding