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Young, E. F., Perkowski, E., Malik, S., Hayden, J. D., Durham, P. G., Zhong, L., Welch, J. T., Braunstein, Miriam S., Hickey, Anthony J.
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Erratum for Perkowski et al., "The EXIT Strategy: an Approach for Identifying Bacterial Proteins Exported during Host Infection"
Perkowski, E F, Zulauf, K E, Weerakoon, D, Hayden, J D, Ioerger, T R, Oreper, D, Gomez, S M, Sacchettini, J C, Braunstein, M
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A prospective study of ambulatory laparoscopic cholecystectomy : Training economic, and patient benefits
JAIN, P. K, HAYDEN, J. D, SEDMAN, P. C, ROYSTON, C. M. S, O'BOYLE, C. J
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Published in Surgical endoscopy (01.08.2005)
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Packed bed compression visualisation and flow simulation using an erosion-dilation approach
Johnson, T.F., Iacoviello, F., Hayden, D.J., Welsh, J.H., Levison, P.R., Shearing, P.R., Bracewell, D.G.
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The role of microsatellite instability in gastric carcinoma
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Comparison of the prognostic value of the 6th and 7th editions of the Union for International Cancer Control TNM staging system in patients with lower esophageal cancer undergoing neoadjuvant chemotherapy followed by surgery
Mehta, S. P., Jose, P., Mirza, A., Pritchard, S. A., Hayden, J. D., Grabsch, H. I.
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A comparison of microsatellite instability in early onset gastric carcinomas from relatively low and high incidence European populations
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Published in International journal of cancer (15.01.2000)
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Hayden, Jeremy D., Cawkwell, Lynn, Sue‐Ling, Henry, Johnston, David, Dixon, Michael F., Quirke, Philip, Martin, Iain G.
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Minimally invasive management of chylous fistula after esophagectomy
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Scaling of poly-encapsulated LOCOS for 0.35 μm CMOS technology
KENKARE, P. U, MAZURE, C, HAYDEN, J. D, PFIESTER, J. R, KO, J, KIRSCH, H. C, AJURIA, S. A, CRABTREE, P, VUONG, T
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Published in IEEE transactions on electron devices (1994)
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The SCC BJT: a high-performance bipolar transistor compatible with high-density deep-submicrometer BiCMOS SRAM technologies
Taft, R.C., Lage, C.S., Hayden, J.D., Kirsch, H.C., Lin, J.-H., Denning, D.J., Shapiro, F.B., Bockelman, D.E., Camilleri, N.
Published in IEEE transactions on electron devices (01.07.1995)
Published in IEEE transactions on electron devices (01.07.1995)
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