Search Results - "HASE, KENICHI" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Expression of an NADP-malic enzyme gene in rice (Oryza sativa. L) is induced by environmental stresses; over-expression of the gene in Arabidopsis confers salt and osmotic stress tolerance

Expression of an NADP-malic enzyme gene in rice (Oryza sativa. L) is induced by environmental stresses; over-expression of the gene in Arabidopsis confers salt and osmotic stress tolerance

by Liu, Shenkui, Cheng, Yuxiang, Zhang, Xinxin, Guan, Qingjie, Nishiuchi, Shunsaku, Hase, Kenichi, Takano, Tetsuo
Published in Plant molecular biology (01.05.2007)

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Journal Article

TESTING DEVICE

TESTING DEVICE

by HASE KENICHI
Year of Publication 26.02.2009

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Patent

JITTER APPLYING CIRCUIT, ELECTRONIC DEVICE AND TESTING DEVICE

JITTER APPLYING CIRCUIT, ELECTRONIC DEVICE AND TESTING DEVICE

by HASE KENICHI
Year of Publication 26.02.2009

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Patent

Gain-controlled integrator technique for a 50 MHz, 100 mW, 0.4 mu m CMOS, 7th-order equiripple Gm-C filter

Gain-controlled integrator technique for a 50 MHz, 100 mW, 0.4 mu m CMOS, 7th-order equiripple Gm-C filter

by Toyota, Kenji, Matsuura, Tatsuji, Hase, Kenichi
Published in Digest of technical papers - IEEE International Solid-State Circuits Conference (01.02.1997)

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Journal Article

MEASURING DEVICE, MEASURING METHOD, ELECTRONIC DEVICE AND PROGRAM

MEASURING DEVICE, MEASURING METHOD, ELECTRONIC DEVICE AND PROGRAM

by HASE KENICHI, ISHIDA MASAHIRO
Year of Publication 30.06.2011

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Patent

SIGNAL PROCESSING DELAY APPARATUS

SIGNAL PROCESSING DELAY APPARATUS

by HASE, KENICHI, ISHIDA, YOSHITERU, HORITA, RYUTARO, WATANABE, KUNIO, NARA, TAKASHI, KIMURA, HIROSHI
Year of Publication 20.03.1999

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Patent

TESTING APPARATUS, TESTING METHOD, AND DEVICE

TESTING APPARATUS, TESTING METHOD, AND DEVICE

by HASE KENICHI, ISHIDA MASAHIRO
Year of Publication 18.11.2010

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Patent

TESTING APPARATUS AND TESTING METHOD

TESTING APPARATUS AND TESTING METHOD

by HASE KENICHI, ISHIDA MASAHIRO
Year of Publication 18.11.2010

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Patent

TRANSMISSION CHARACTERISTIC MEASUREMENT APPARATUS, TRANSMISSION CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRONIC DEVICE

TRANSMISSION CHARACTERISTIC MEASUREMENT APPARATUS, TRANSMISSION CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRONIC DEVICE

by ISHIDA MASAHIRO, HASE KENICHI
Year of Publication 28.10.2010

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Patent

JITTER ADDITION APPARATUS AND TEST APPARATUS

JITTER ADDITION APPARATUS AND TEST APPARATUS

by NAKAMURA TAKAYUKI, HASE KENICHI
Year of Publication 24.06.2010

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Patent

SYNC. DATA INTRODUCING METHOD AND SYSTEM

SYNC. DATA INTRODUCING METHOD AND SYSTEM

by URAGAMI, AKIRA, HASE, KENICHI, HOTTA, RYUTARO, KIMURA, HIROSHI, MIYAZAWA, SHOICHI, HIRANO, AKIHIKO
Year of Publication 16.11.1995

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Patent

SIGNAL DISTRIBUTION CIRCUIT

SIGNAL DISTRIBUTION CIRCUIT

by HASE KENICHI
Year of Publication 31.01.2003

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Patent

MAGNETIC DISK DEVICE AND MAGNETIC DISK SYSTEM

MAGNETIC DISK DEVICE AND MAGNETIC DISK SYSTEM

by HASE KENICHI
Year of Publication 07.12.2001

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Patent

EXECUTION ENVIRONMENT SELECTION SYSTEM, EXECUTION ENVIRONMENT SELECTING METHOD, AND EXECUTION ENVIRONMENT SELECTION PROGRAM

EXECUTION ENVIRONMENT SELECTION SYSTEM, EXECUTION ENVIRONMENT SELECTING METHOD, AND EXECUTION ENVIRONMENT SELECTION PROGRAM

by TAKAHARA KIYOSHI, KOBAYASHI KENZO, HASE KENICHI
Year of Publication 11.03.2010

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Patent

SEMICONDUCTOR WAFER

SEMICONDUCTOR WAFER

by HASE KENICHI
Year of Publication 18.12.1992

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Patent

IC TESTER

IC TESTER

by HASE KENICHI
Year of Publication 21.07.1992

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Patent

TESTING METHOD FOR SEMICONDUCTOR

TESTING METHOD FOR SEMICONDUCTOR

by HASE KENICHI
Year of Publication 05.08.1991

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Patent

SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY

by HASE KENICHI
Year of Publication 20.11.1990

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Patent

TESTER AND DEVICE

TESTER AND DEVICE

by SAWARA ATSUO, NAKAGAWA HIROSHI, HASE KENICHI
Year of Publication 04.12.2008

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Patent

SEMICONDUCTOR TESTING DEVICE AND ITS TESTING METHOD

SEMICONDUCTOR TESTING DEVICE AND ITS TESTING METHOD

by HASHIMOTO OSAMU, HASE KENICHI
Year of Publication 23.02.1993

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Patent

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