RFID tag design with circuitry for wafer level testing
Glidden, Robert M, Hara, Dennis Kiyoshi, Oliver, Ronald A, Kuhn, Jay A, Hyde, John D
Year of Publication 11.12.2007
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Year of Publication 11.12.2007
Patent
RFID tag design with circuitry for wafer level testing
HARA DENNIS KIYOSHI, GLIDDEN ROBERT M, HYDE JOHN D, KUHN JAY A, OLIVER RONALD A
Year of Publication 11.12.2007
Get full text
Year of Publication 11.12.2007
Patent