A general approach for degradation modeling to enable a widespread use of aging simulations in IC design
Lange, André, Gonzalez, Fabio A. Velarde, Giering, Kay-Uwe, Vervantidis, Anastasios, Hahne, Lukas, Heinig, Andy, Jancke, Roland
Published in Microelectronics and reliability (01.10.2022)
Published in Microelectronics and reliability (01.10.2022)
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Journal Article
ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs
Hahne, Lukas, Velarde, G. Fabio A., Lange, Andre, Sohrmann, Christoph, Wetzel, Daniel, Crocoll, Sonja
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
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Conference Proceeding
On the Interpolation from Transistor Figures of Merit to Compact Model Parameters
Hahne, Lukas, Wagner, Jakob, Gonzalez, Fabio A. Velarde, Giering, Kay-Uwe, Lange, André
Published in IFAC-PapersOnLine (01.01.2022)
Published in IFAC-PapersOnLine (01.01.2022)
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Journal Article
Supporting analog design for reliability by efficient provision of reliability information to designers
Velarde Gonzalez, Fabio A., Hahne, Lukas, Ortstein, Katrin, Lange, Andre, Crocoll, Sonja
Published in 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (03.05.2023)
Published in 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (03.05.2023)
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Conference Proceeding
Attention on Abstract Visual Reasoning
Hahne, Lukas, Lüddecke, Timo, Wörgötter, Florentin, Kappel, David
Published in arXiv.org (14.11.2019)
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Published in arXiv.org (14.11.2019)
Paper