Ultraviolet radiation round-robin testing of various backsheets for photovoltaic modules
Koehl, Michael, Ballion, Amal, Yu-Hsien Lee, Hung-Sen Wu, Scott, Kurt, Glick, Stephen, Hacke, Peter, Hyun Jin Koo
Published in 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) (01.06.2015)
Published in 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) (01.06.2015)
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Conference Proceeding
Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress
Hacke, Peter, Smith, Ryan, Terwilliger, Kent, Glick, Stephen, Jordan, Dirk, Johnston, Steve, Kempe, Michael, Kurtz, Sarah
Published in 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 (01.06.2012)
Published in 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 (01.06.2012)
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Conference Proceeding
A study of the relationship between junction depth and GaAs solar cell performance under a 1 MeV electron fluence
Hacke, Peter, Uesugi, Masato, Matsuda, Sumio
Published in Solar energy materials and solar cells (11.09.1994)
Published in Solar energy materials and solar cells (11.09.1994)
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Journal Article
Conference Proceeding