Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip
Houdellier, F., de Knoop, L., Gatel, C., Masseboeuf, A., Mamishin, S., Taniguchi, Y., Delmas, M., Monthioux, M., Hÿtch, M.J., Snoeck, E.
Published in Ultramicroscopy (01.04.2015)
Published in Ultramicroscopy (01.04.2015)
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Journal Article
Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection
Phatak, C., Knoop, L. de, Houdellier, F., Gatel, C., Hÿtch, M.J., Masseboeuf, A.
Published in Ultramicroscopy (01.05.2016)
Published in Ultramicroscopy (01.05.2016)
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Journal Article
Dynamical effects in strain measurements by dark-field electron holography
Javon, E., Lubk, A., Cours, R., Reboh, S., Cherkashin, N., Houdellier, F., Gatel, C., Hÿtch, M.J.
Published in Ultramicroscopy (01.12.2014)
Published in Ultramicroscopy (01.12.2014)
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Journal Article
Calibration of projector lens distortions
Hüe, F, Johnson, C L, Lartigue-Korinek, S, Wang, G, Buseck, P R, Hÿtch, M J
Published in Journal of electron microscopy (01.06.2005)
Published in Journal of electron microscopy (01.06.2005)
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Journal Article
Optimization of off-axis electron holography performed with femtosecond electron pulses
Houdellier, F., Caruso, G.M., Weber, S., Hÿtch, M.J., Gatel, C., Arbouet, A.
Published in Ultramicroscopy (01.07.2019)
Published in Ultramicroscopy (01.07.2019)
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Journal Article
Atomic order in magnetic Mn inclusions in Si crystals: XAS and TEM studies
Wolska, A., Lawniczak-Jablonska, K., Kret, S., Dłużewski, P., Szczepańska, A., Klepka, M., Walczak, M.S., Lefrais, Y., Hÿtch, M.J., Misiuk, A.
Published in Journal of non-crystalline solids (01.10.2008)
Published in Journal of non-crystalline solids (01.10.2008)
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Journal Article
Conference Proceeding
Selective growth of tensily strained Si1-yCy films on patterned Si substrates
GOUYE, A, HILE, F, HALIMAOUI, A, KERMARREC, O, CAMPIDELLI, Y, HYTCH, M. J, HOUDELLIER, F, CLAVERIE, A, BENSAHEL, D
Published in Materials science in semiconductor processing (01.02.2009)
Published in Materials science in semiconductor processing (01.02.2009)
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Conference Proceeding
Journal Article
Evidence of sharp and diffuse domain walls in BiFeO3 by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopy
Lubk, A, Rossell, M D, Seidel, J, He, Q, Yang, S Y, Chu, Y H, Ramesh, R, Hÿtch, M J, Snoeck, E
Published in Physical review letters (27.07.2012)
Published in Physical review letters (27.07.2012)
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Journal Article
Control of grain size and morphologies of nanograined ferrites by adaptation of the synthesis route: mechanosynthesis and soft chemistry
Guigue-Millot, N., Bégin-Colin, S., Champion, Y., Hÿtch, M.J., Le Caër, G., Perriat, P.
Published in Journal of solid state chemistry (2003)
Published in Journal of solid state chemistry (2003)
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Journal Article
HRTEM study of defects in twin boundaries of ultra-fine grained copper
Sennour, M., Lartigue-Korinek, S., Champion, Y., Hÿtch†, M. J.
Published in Philosophical magazine (Abingdon, England) (01.04.2007)
Published in Philosophical magazine (Abingdon, England) (01.04.2007)
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Journal Article
Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy
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Journal Article
Conference Proceeding
Tests on the validity of the atomic column approximation for STEM probe propagation
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Journal Article
Conference Proceeding
Strain mapping in nanowires
Taraci, J L, Hÿtch, M J, Clement, T, Peralta, P, McCartney, M R, Drucker, Jeff, Picraux, S T
Published in Nanotechnology (01.10.2005)
Published in Nanotechnology (01.10.2005)
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Journal Article
Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy
Hÿtch, M. J., Putaux, J.-L., Thibault, J.
Published in Philosophical magazine (Abingdon, England) (11.10.2006)
Published in Philosophical magazine (Abingdon, England) (11.10.2006)
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Journal Article