Volume Expansion during Lithiation of Amorphous Silicon Thin Film Electrodes Studied by In-Operando Neutron Reflectometry
Jerliu, B, Hüger, E, Dörrer, L, Seidlhofer, B.-K, Steitz, R, Oberst, V, Geckle, U, Bruns, M, Schmidt, H
Published in Journal of physical chemistry. C (08.05.2014)
Published in Journal of physical chemistry. C (08.05.2014)
Get full text
Journal Article
Neutron reflectometry studies on the lithiation of amorphous silicon electrodes in lithium-ion batteries
Jerliu, B, Drrer, L, Hger, E, Borchardt, G, Steitz, R, Geckle, U, Oberst, V, Bruns, M, Schneider, O, Schmidt, H
Published in Physical chemistry chemical physics : PCCP (01.01.2013)
Published in Physical chemistry chemical physics : PCCP (01.01.2013)
Get full text
Journal Article
Li self-diffusion in lithium niobate single crystals at low temperatures
Rahn, J, Hger, E, Drrer, L, Ruprecht, B, Heitjans, P, Schmidt, H
Published in Physical chemistry chemical physics : PCCP (01.01.2012)
Published in Physical chemistry chemical physics : PCCP (01.01.2012)
Get full text
Journal Article
Lithium diffusion in congruent LiNbO3 single crystals at low temperatures probed by neutron reflectometry
Hüger, E, Rahn, J, Stahn, J, Geue, T, Heitjans, P, Schmidt, H
Published in Physical chemistry chemical physics : PCCP (28.02.2014)
Published in Physical chemistry chemical physics : PCCP (28.02.2014)
Get full text
Journal Article
Grain boundary self-diffusion in Fe films with a stable nanostructure
Schmidt, H., Chakravarty, S., Jiang, M., Hüger, E., Parida, P. K., Geue, T., Stahn, J., Tietze, U., Lott, D.
Published in Journal of materials science (01.05.2012)
Published in Journal of materials science (01.05.2012)
Get full text
Journal Article
A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam
Vezhlev, E., Ioffe, A., Mattauch, S., Staringer, S., Ossovyi, V., Felder, Ch, Hüger, E., Vacik, J., Tomandl, I., Hnatowicz, V., Chen, C., Notten, P.H.L., Brückel, Th
Published in Radiation effects and defects in solids (03.03.2020)
Published in Radiation effects and defects in solids (03.03.2020)
Get full text
Journal Article
A neutron reflectometry study on silicon self-diffusion at 900 °C
Hüger, E., Kube, R., Bracht, H., Stahn, J., Geue, T., Schmidt, H.
Published in physica status solidi (b) (01.11.2012)
Published in physica status solidi (b) (01.11.2012)
Get full text
Journal Article
Determination of volume self-diffusivities in ultrafine-grained metals using neutron reflectometry
Chakravarty, S., Hüger, E., Schmidt, H., Horisberger, M., Stahn, J., Lalla, N.P.
Published in Scripta materialia (01.12.2009)
Published in Scripta materialia (01.12.2009)
Get full text
Journal Article
Room temperature oxidation of magnetron sputtered Si–C–N films
Hüger, E., Gao, D., Markwitz, A., Geckle, U., Bruns, M., Schmidt, H.
Published in Applied surface science (15.01.2012)
Published in Applied surface science (15.01.2012)
Get full text
Journal Article
Quantum well states in thin (110)-oriented Au films and k-space symmetry
HÜGER, E, OSUCH, K
Published in The European physical journal. B, Condensed matter physics (01.01.2004)
Published in The European physical journal. B, Condensed matter physics (01.01.2004)
Get full text
Journal Article