Fault Injection Analysis of Bidirectional Signals
Aguirre, M.A., Tombs, J.N., Guzman Miranda, H.
Published in IEEE transactions on nuclear science (01.08.2009)
Published in IEEE transactions on nuclear science (01.08.2009)
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Journal Article
Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors
Guzman-Miranda, H., Aguirre, M.A., Tombs, J.
Published in IEEE transactions on instrumentation and measurement (01.05.2009)
Published in IEEE transactions on instrumentation and measurement (01.05.2009)
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Journal Article
On the design of tunable fault tolerant circuits on SRAM-based FPGAs for safety critical applications
Sterpone, L., Aguirre, M., Tombs, J., Guzman-Miranda, H.
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
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Conference Proceeding
TCAD Simulations on CMOS Propagation Induced Pulse Broadening Effect: Dependence Analysis on the Threshold Voltage
Mogollón, J M, Palomo, F R, Aguirre, M A, Nápoles, J, Guzmán-Miranda, H, García-Sánchez, E
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
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Journal Article
Pulsed Laser SEU Cross Section Measurement Using Coincidence Detectors
Palomo, F.R., Mogollon, J.M., Napoles, J., Guzman-Miranda, H., Vega-Leal, A.P., Aguirre, M.A., Moreno, P., Mendez, C., de Aldana, J.R.V.
Published in IEEE transactions on nuclear science (01.08.2009)
Published in IEEE transactions on nuclear science (01.08.2009)
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Journal Article
Realization of a flexible platform for fruit inspection and classification applications with emphasis in rapid prototyping and development
Guzman-Miranda, H., Napoles, J., Patio, A., Mateos, R., Matias, M., Amador, J., Tombs, J., Aguirre, M.A., Perez-Cordoba, J.
Published in 2009 35th Annual Conference of IEEE Industrial Electronics (01.11.2009)
Published in 2009 35th Annual Conference of IEEE Industrial Electronics (01.11.2009)
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Conference Proceeding
Contrast of a HDL model and COTS version of a microprocessor for soft-error testing
Isaza-Gonzalez, Jose, Serrano-Cases, Alejandro, Martinez-Alvarez, Antonio, Cuenca-Asensi, Sergio, Guzman-Miranda, H., Aguirre, Miguel A.
Published in 2017 18th IEEE Latin American Test Symposium (LATS) (01.03.2017)
Published in 2017 18th IEEE Latin American Test Symposium (LATS) (01.03.2017)
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Conference Proceeding
FTUNSHADES2: A novel platform for early evaluation of robustness against SEE
Mogollon, J. M., Guzman-Miranda, H., Napoles, J., Barrientos, J., Aguirre, M. A.
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
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Conference Proceeding
Advanced speeding-up techniques for SEU sensitivity assessment
Grosso, M, Guzman-Miranda, H
Published in 2010 IEEE International Symposium on Industrial Electronics (01.07.2010)
Published in 2010 IEEE International Symposium on Industrial Electronics (01.07.2010)
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Conference Proceeding
On the modelling of SEU effects on spread spectrum wireless systems
Lopez Gonzalez, P., Baena Lecuyer, V., Guzman Miranda, H., Barrientos Rojas, J., Aguirre, M. A.
Published in 2014 IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE) (01.10.2014)
Published in 2014 IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE) (01.10.2014)
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Conference Proceeding
Real time SEU detection and diagnosis for safety or mission-critical ICs using HASH library-based fault dictionaries
Mogollon, J. M., Napoles, J., Guzman-Miranda, H., Aguirre, M. A.
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
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Conference Proceeding
A Novel Co-Design Approach for Soft Errors Mitigation in Embedded Systems
Cuenca-Asensi, S, Martinez-Alvarez, A, Restrepo-Calle, F, Palomo, F R, Guzman-Miranda, H, Aguirre, M A
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article
A non-invasive system for the measurement of the robustness of microprocessor-type architectures against radiation-induced soft errors
Guzman-Miranda, H., Aguirre, M.A., Tombs, J.
Published in 2008 IEEE Instrumentation and Measurement Technology Conference (01.05.2008)
Published in 2008 IEEE Instrumentation and Measurement Technology Conference (01.05.2008)
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Conference Proceeding
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment
Grosso, M., Guzman-Miranda, H., Aguirre, M. A.
Published in IEEE transactions on industrial informatics (01.02.2013)
Published in IEEE transactions on industrial informatics (01.02.2013)
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Journal Article
TCAD simulations on CMOS propagation induced pulse broadening effect: Dependence analysis on the NMOS VT
Mogollon, J. M., Palomo, F. R., Aguirre, M. A., Napoles, J., Guzman-Miranda, H., Garcia-Sanchez, E.
Published in 2009 European Conference on Radiation and Its Effects on Components and Systems (01.09.2009)
Published in 2009 European Conference on Radiation and Its Effects on Components and Systems (01.09.2009)
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Conference Proceeding
A Complete Emulation System for Single Event Effects Analysis
Napoles, J., Guzman-Miranda, H., Aguirre, M., Tombs, J.N., Mogollon, J.M., Palomo, R., Vega-Leal, A.P.
Published in 2008 4th Southern Conference on Programmable Logic (01.03.2008)
Published in 2008 4th Southern Conference on Programmable Logic (01.03.2008)
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Conference Proceeding